表面と真空
Online ISSN : 2433-5843
Print ISSN : 2433-5835
特集「ナノスケール3次元分析の最前線」
蛍光X線ホログラフィーによる3次元原子イメージ研究の進展
細川 伸也林 好一木村 耕治八方 直久松下 智裕
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2018 年 61 巻 12 号 p. 784-789

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In recent years, X-ray fluorescence holography (XFH) investigations are remarkably developed to draw three-dimensional (3D) atomic images and to clarify local structures of functional materials, which can compensate for disadvantages of other methods for structural characterizations such as diffraction and X-ray absorption fine structure (XAFS). One of the important topics on the XFH experiments is to find an impurity site in a crystal. The second is to utilize a two-dimensional detector for saving data acquisition time and for conducting valence-selective XFH experiments. In this article, recent progresses of the XFH technique and their applications to functional materials are introduced.

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