2018 年 61 巻 12 号 p. 784-789
In recent years, X-ray fluorescence holography (XFH) investigations are remarkably developed to draw three-dimensional (3D) atomic images and to clarify local structures of functional materials, which can compensate for disadvantages of other methods for structural characterizations such as diffraction and X-ray absorption fine structure (XAFS). One of the important topics on the XFH experiments is to find an impurity site in a crystal. The second is to utilize a two-dimensional detector for saving data acquisition time and for conducting valence-selective XFH experiments. In this article, recent progresses of the XFH technique and their applications to functional materials are introduced.