2018 Volume 61 Issue 4 Pages 209-214
Advanced principal identification technique is required owing to development of information-oriented society. One of the most widely used authentication technologies today is the biometric authentication. However, there are fragilitas, such as falsification or imitation. In this situation, an artifact metrics authentication technique was proposed. It is authenticated by intrinsic random patterns of the artifacts. Since a carbon nanotube has various properties e.g. Raman scattering and photoluminescence, we demonstrate authentication of carbon nanotube composite papers for artifact metrics. The merits are easiness of normalization and fabrication processes, and impossible cloning. In this study, an estimated error rate as small as 10−15 was achieved when random patterns of densities, positions, or the different chiralities were authenticated.