Vacuum and Surface Science
Online ISSN : 2433-5843
Print ISSN : 2433-5835
Special Issue : Secondary Ion Mass Spectrometry (SIMS) —Recent Trends and Organic Analysis—
Evaluation and Data Analysis of Biological Samples and Biomolecules by Means of Time-of-flight Secondary Ion Mass Spectrometry with Cluster Ion Beam
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2018 Volume 61 Issue 7 Pages 458-462


Thanks to the development of a variety of huge cluster ion sources, time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been applied to more fields. By means of gas cluster ion beams (GCIB) such as Ar cluster ions, 3D analysis of soft materials including biological cells and tissues is feasible. Moreover, the sputtering by GCIB is useful for removing damage caused by a conventional primary ion beam such as a Bi cluster ion beam. In addition, recently instrumental issues regarding mass spectrometers (MS) have been improved by introducing tandem MS and orbital ion trap MS to TOF-SIMS, which made TOF-SIMS more powerful for bio sample analysis. On the other hand, data analysis techniques are getting more important to interpret such TOF-SIMS data.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
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