Vacuum and Surface Science
Online ISSN : 2433-5843
Print ISSN : 2433-5835
Special Feature : New Current of Analytical Technology for Soft Interfaces
Biomaterial Surface and Interface Analysis by Means of Time-of-Flight Secondary Ion Mass Spectrometry
Satoka AOYAGI
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JOURNAL FREE ACCESS

2019 Volume 62 Issue 4 Pages 211-216

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Abstract

Thanks to the development of gas cluster ion beam (GCIB) such as an Ar cluster ion beam, the application of TOF-SIMS has been growing, especially in biological fields. GCIB enables sputtering of soft materials including biological cells and tissues to provide 3D images. The features of the latest TOF-SIMS related techniques and applications of TOF-SIMS into biological samples, such as hair, skin, cells, and tissues, and bio-model samples for biomolecule investigation are briefly introduced in this article.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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