2020 Volume 63 Issue 1 Pages 3-6
Generation and analysis of electron beams are of great use still today to elucidate electronic and microscopic features of solid materials. Some interesting methods, in terms of visualization of physical property at the sub-micrometer-scale structures, are addressed from researchers’ view point in the fields of material science and technology. Readers will conceive something new in the introduced articles that appear in this special issue of the journal.