Vacuum and Surface Science
Online ISSN : 2433-5843
Print ISSN : 2433-5835
Special Feature : Observation and Control of Micro Energy
Surface Charge Migration Tracked by Tip-Synchronized Time-Resolved Electrostatic Force Microscopy
Takuya MATSUMOTOKento ARAKIKentaro KAJIMOTO
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2020 Volume 63 Issue 5 Pages 245-250

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Abstract

Nanoscale observation of charge migration is crucial for understanding and controlling functional materials and devices. We developed tip-synchronized time-resolved electrostatic force microscopy. The analysis of cantilever motion provides the temporal resolution with the timescale of cantilever vibration cycle. The observation of sub-microsecond charge migration is achieved for photovoltaic bilayer and conductive polymer thin films by a movie with 0.3 microsecond frame step time resolution.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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