Vacuum and Surface Science
Online ISSN : 2433-5843
Print ISSN : 2433-5835
Special Feature : Transactions of the Annual Meeting on the Japan Society of Vacuum and Surface Science 2019[III]
Electrical Conductivity Across Line Defects on the Si(111)-7×7 Surface
Masayuki HAMADAYukio HASEGAWA
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2020 Volume 63 Issue 8 Pages 431-436

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Abstract

We have developed scanning tunneling potentiometry (STP) operating in ultrahigh vacuum conditions, which provides us a surface topography and the corresponding electrochemical potential distribution simultaneously in nanometer scale special resolution and µV-level potential sensitivity under a lateral electrical current flowing parallel to the sample surface. Using this setup, we have successfully performed an STP measurement on the Si(111)-7×7 reconstructed surface, which holds metallic surface states. Our observation indicates that not only steps but also phase boundaries of the Si(111)-7×7 surface work as an electrical resistance impeding the conductance through the surface states. From the evaluation of the ratio of conductivity across the one-dimensional line defects to that of the terrace on the Si(111)-7×7 surface, the conductivity of the phase boundary is found five times that of the monolayer-height step.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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