Vacuum and Surface Science
Online ISSN : 2433-5843
Print ISSN : 2433-5835
Special Feature : Transactions of the Annual Meeting on the Japan Society of Vacuum and Surface Science 2019[III]
Atomic Force Microscopy for Measuring Mechanical Properties of Cells in the Cortical Regions
Yuki FUJIITakaharu OKAJIMA
Author information
JOURNALS RESTRICTED ACCESS

2020 Volume 63 Issue 8 Pages 437-440

Details
Abstract

Atomic force microscopy has become one of the most widely used tools in the mechanical characterization of cells to quantify elastic and viscoelastic properties. Here we briefly review AFM techniques, such as force curve, stress relaxation, creep, and force modulation measurements, developed for examining the mechanical properties of cells and describe how specific features of cellular samples are characterized.

Fullsize Image
Information related to the author

この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
Previous article Next article
feedback
Top