特集「2019年日本表面真空学会学術講演会特集号Ⅲ」
原子間力顕微鏡法：細胞表面近傍のナノメカニクス
2020 年 63 巻 8 号 p. 437-440
詳細
2020 年 63 巻 8 号 p. 437-440
Atomic force microscopy has become one of the most widely used tools in the mechanical characterization of cells to quantify elastic and viscoelastic properties. Here we briefly review AFM techniques, such as force curve, stress relaxation, creep, and force modulation measurements, developed for examining the mechanical properties of cells and describe how specific features of cellular samples are characterized.
