特集「マイクロビームアナリシス技術部会特集号」
「マイクロビームアナリシス技術部会特集号」企画趣旨
2021 年 64 巻 10 号 p. 450-451
詳細
2021 年 64 巻 10 号 p. 450-451
The division of Microbeam Analysis (MBA) was established in May 2020. This division conducts various activities such as regular research meetings, training seminars, international symposia, and so on. This special issue introduces recent research topics on atomic-resolution holography, electron microscopy, Secondary Ion Mass Spectroscopy, and multimodal data analysis. The database for Auger and secondary electron spectra that is available online is also introduced.
