表面と真空
Online ISSN : 2433-5843
Print ISSN : 2433-5835
特集「薄膜・表面物理における研究手法技術の最新動向」
低エネルギー電子顕微鏡を用いた二次元物質のナノスケール構造解析
日比野 浩樹 Shengnan Wang影島 博之
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2025 年 68 巻 2 号 p. 97-104

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Low-energy electron microscopy (LEEM) is a powerful tool for investigating the structures of 2D materials at the nanoscale. In this paper, following a review of structural information obtained from LEEM characterizations, the growth of hexagonal boron nitride (hBN) and its heterostructures with graphene is investigated in detail using LEEM. We have demonstrated that unidirectional hBN islands grow on inclined Cu(101) surfaces, and that the orientation of these islands changes in response to the orientation of steps on the vicinal Cu(101) surface. This indicates that the Cu substrate steps play a key role in determining the orientation of hBN. Additionally, we have successfully controlled the growth of both lateral and vertical heterostructures of graphene and hBN on Cu substrates by adjusting the supply sequence of their precursors.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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