Host: The Institute of Image Electronics Engineers of Japan
We propose a photometric method that simultaneously estimates the surface reflectance and geometry properties from four images. In an iterative framework, the specular reflectance is estimated with a reflectance recovery algorithm which uses the data all over the object, and addresses the problem of data inadequacy. Using the result of the specular reflectance recovery, a Photometric Stereo procedure is applied to estimate the local surface parameters at local points. Our approach integrates reflectance recovery and the photometric stereo technique to yield accurate separation, reflectance and surface orientation as demonstrated by our results on synthetic and real images.
