Co-operative investigations of quantometric analysis of lead alloys has been carried out by Furukawa Electric Co., Yokohama Works and the Kawasaki Branch of Industrial Research Institute of Kanagawa Prefecture, using ARL's Industrial Research Quantometer. Up to the present time, the method of chemical analysis has generally been adopted for the inspection of raw materials and products. The present investigations were initiated to establish the method of quantometricanalysis of lead alloys in order to increase the efficiency of these inspections.
The object of this investigation was to analyse Pb-Sb, Pb-Sn binary alloys, Pb-Sb-Sn ternaryalloy etc. The studies were first carried out for simple binary alloys, and then for ternary alloy.
The analytical line pairs Sb I 2598.06/Pb I 4057.82 and Sn I 3262.3/Pb I 4057.82 were used under the source condition of Multisource low voltage spark L=130μH, C=5μF, R=100Ω, V=940 V in the case of binary alloys. No effect of surface finish and surface oxidation of the sampleswas found under the experimental conditions used.
The method thus established was then applied to the inspection of raw materials and products. About 200 samples of Pb-Sb alloy, and 300 samples of Pb-Sn alloys were analyzed quantometrically and were compared with the results of chemical analysis.
In the case of Pb-Sb ingot samples (Sb 0.8-0.9%) and Pb-Sn ingot samples (Sn 1.9-2.0%), the method was practically applicable. It was found, however, in the case of lead sheath, deviations of quantometric analysis from the chemical value were rather large, and therefore further studies seem to be necessary.
The accuracy of the quantometric analysis was 3-5% for Pb-Sb ingot and Pb-Sb cable sheath, 1-2% for Pb-Sn ingot, and 2-3% for Pb-Sn c ble sheath.
Studies were then carried out for Pb-Sb-Sn ternary alloy, to determine not only the major constituents Sb and Sn but also Cu which is occasionally contained as impurity. The analytical line pairs used in this case were Sb I 2598.06/Pb I 4057.82, Sn I 3262.3/Pb I 4057.82 and Cu I 3274. 0/Pb I 4057.82 under the source condition of high voltage spark V=20KV, C=0, 007μF, L=OμH. The precision of the analysis was 2-4% for 0.26-0.28% Sb, 3-5% for 1.50-2.23% Sn and 3-5% for 0.011-0.012% Cu.
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