Wool and nylon 6 fabrics were dyed with direct and acid dyes in yellow, red and blue, and then treated by sputter etching and silicone resin coating. The apparent color depth (K/S) value of both treated fabrics was increased, especially by sputter etching. Change in color was investigated by metric lightness (L
*), metric chroma (C
*), metric hue angle (h) and color difference (ΔE
*) parameters on the basis of CIELAB color system. ΔE
* was especially increased by sputter etching. In this case, the decrease of L
* was small, whereas C
* increased remarkably. Especially the increase of C
* by sputter etching was brought about at high dye concentration. On the other hand, the increase of C
* by silicone resin coating was not observed. As is evident from SEM observation, innumerable fine microcraters were produced on the fiber surface by sputter etching. These microcraters play an important role for the repression of light reflectance. For example, it is clear that the microcraters contributes to the increase of C
* of the dyed wool and nylon 6 fabrics.
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