Japanese Magazine of Mineralogical and Petrological Sciences
Online ISSN : 1349-7979
Print ISSN : 1345-630X
ISSN-L : 1345-630X
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Volume 45, Issue 3
May
Displaying 1-3 of 3 articles from this issue
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Key Points for Technical Skills in Analyzing Minerals and Experimental Works
  • Some notes on XAFS measurement: hole and thickness effects
    Yoshio TAKAHASHI
    2016 Volume 45 Issue 3 Pages 93-98
    Published: 2016
    Released on J-STAGE: August 05, 2016
    DOIhttps://doi.org/10.2465/gkk.160220
    JOURNAL FREE ACCESS
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    X-ray absorption fine structure (XAFS) spectroscopy is widely used in various fields in earth sciences. The measurement of the spectra can be conducted both in transmission and fluorescence modes. Accurate and precise XAFS spectra should be obtained for the determination of the local structure and chemical species of a target element. In this manuscript, hole effect, thickness effect, and other related problems in the XAFS analysis were explained to measure correct XAFS spectra within a limited time, because most of XAFS spectra are measured in synchrotron radiation facilities.
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New Minerals and Occurrences in Japan
Instructions for Contributors
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