Demands for analysis of new materials, for instance, interface structure of light element materials, voids in resins, and structure of carbon-based composite materials are increasing, and new methods and inspection equipment such as microfocus X-ray CT and X-ray phase imaging are being developed. Improving the performance of these equipment, it is important to develop an X-ray detector with sufficient sensitivity and resolution. We focused on halide perovskite materials, which have been developed significantly as solar cell materials. We aimed to develop an X-ray detector with the sensitivity of a CdTe (cadmium telluride) radiation detector and the spatial resolution of a CCD using Methylammonium Lead Iodide (MAPbI
3), forming an X-ray photoelectric conversion MAPbI
3 film on a charge readout substrate directly. We dropped a solution in which MAPbI
3 microcrystals were dispersed onto a substrate and heated it to create a uniform polycrystalline 1mm thick film, and evaluated its X-ray detection characteristics. Furthermore, to improve the performance of the detector, we examined the charge injection blocking layer and the quality of the perovskite film by using additives. In this paper, we will discuss the development of these elemental technologies to realize the high-sensitivity, high-resolution perovskite radiation detector.
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