In this study, we have measured negative ion mobility in high-purity O
2 (99.9999%) and ultrahigh-purity O
2 purified with a gas purifier to remove impurities in cylinder O
2 (99.99995%) for the investigation on the effects of impurities. It is considered that negative ion mobility is strong affected by impurities such as N
2, CO
2 and H
2O at high pressure including atmospheric pressure. However, mobility measurement at high pressure has carried out only a few researchers including our laboratory. Then, we have performed the measurement at atmospheric pressure. An interesting result was obtained from ultrahigh-purity O
2 that is the reduced ion mobility increased to 2.39±0.03 cm
2/V·s from the constant value of 2.31±0.03 cm
2/V·s obtained in high-purity O
2 at 2.83×10
-2 ≤
E/
N ≤ 5.31 Td. The difference of these values 2.31 and 2.39 cm
2/V·s was attributed to the impurities that existed in the O
2. The impurity is H
2O contained in the cylinder O
2 which led to a decrease in negative ion mobility. Other impurities such as N
2 and CO
2 are the main constituents of the atmosphere attached on the surfaces of the chamber and electrodes. They led to an increase of ion mobility at high
E/
N values exceeding 1.77 Td.
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