電気学会論文誌E(センサ・マイクロマシン部門誌)
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
126 巻, 6 号
選択された号の論文の11件中1~11を表示しています
特集:マイクロ3次元構造体を実現する各種加工および支援技術
特集解説
  • 服部 正
    2006 年 126 巻 6 号 p. 211-215
    発行日: 2006年
    公開日: 2006/09/01
    ジャーナル フリー
    The precise 3D microstructures with a high aspect ratio are needed in many advance applications. This paper describes recent advantages and prospects of precise 3D microfabrication with a high aspect ratio. Especially LIGA process using synchrotron radiation is applied to pattern regist layers with typical thickness from several μm to 2000μm. Here next technical targets of LIGA process are described. And a variety of ultra Precise 3D microstructures process brought LIGA process allows a new diffraction grating for obtaining high-resolution phase data. We developed the fabrication technique composed MEMS process and LIGA process. The line width and the aspect ratio of this grating are 4μm and above 7, respectively. We evaluated the diffraction grating in SPring 8.
特集論文
  • 井上 宏之, 芳賀 誠士, 丸尾 昭二
    2006 年 126 巻 6 号 p. 216-221
    発行日: 2006年
    公開日: 2006/09/01
    ジャーナル フリー
    Two-photon microstereolithography can provide complicated three-dimensional microstructures with nearly 100 nm resolution in three-dimensions. This technique is one of promising methods to produce disposable functional biochips. However it needs a long time to fabricate thick microstructures owing to its high depth resolution. To solve this problem, we tried to control the thickness of microstructures by changing the numerical aperture of an objective lens and input laser power. As a result, we succeeded in fabricating microgears whose thickness is from 0.59μm to 1.57μm. We also demonstrated that the optical torque of the thick microgear was higher than that of the thin microgear. Additionally the microgear was stably rotated by the optimization of the clearance between the gear and the shaft. Finally we fabricated engaged cogwheels by making each microgear at different height to avoid sticking of the two microgears.
  • 花井 計, 中原 崇, 鈴木 慎也, 松本 佳宣
    2006 年 126 巻 6 号 p. 222-227
    発行日: 2006年
    公開日: 2006/09/01
    ジャーナル フリー
    Arrays of micro overhanging structures were fabricated with very high uniformity by negative-tone photoresist of SU-8 and novel lithography technique, inclined rotary stage and backside exposure. Conventional chrome mask with an array of apertures was used as a substrate, and photoresist was directly spun on the mask. Rotational symmetric structures of SU-8 were obtained by irradiating through the apertures from the backside of the mask, inclining and rotating the stage. It is also possible to fabricate more elaborate and multilevel structures by using another photomask which partially blocks the rays at desired phase of rotation. In addition, light-guiding device with uniform draft angle was prototyped with this technique by using positive-tone photoresist of PMER P-CA1000PM and molding technique.
  • 木村 哲平, 石田 友弘, 服部 正
    2006 年 126 巻 6 号 p. 228-234
    発行日: 2006年
    公開日: 2006/09/01
    ジャーナル フリー
    The rapid microminiaturization of LSI chips has encouraged the need for similarly microminiaturizing the probes of probe cards, the parts used to inspect IC chips. In response to this need, a method of producing 3-dimensional microprobes is devised by etching a substrate in advance and then performing X-ray lithography. By examining and optimizing each part of the process, we produced a 3-dimensional microprobe with the desired shape. The microprobe was 18 μm wide and 50 μm thick, with a tip 185 μm high, consisting of both the spring part and the tip. The mechanical and electrical properties of the microprobe were estimated by measuring the contact force and contact resistance. The measurement showed satisfactory results: the contact force allowed a displacement magnitude as large as 80 μm, accompanied by a satisfactory contact force of 0.39 gf. In addition, the contact resistance exhibited low and stable values when contact was formed on an object made of Au exhibiting a contact force of 0.1 gf or more, demonstrating the high potential of the prototyped microprobes.
  • 久保田 雅則, 三田 吉郎, マーティ フレデリック, ブルイナ タリク, 柴田 直
    2006 年 126 巻 6 号 p. 235-240
    発行日: 2006年
    公開日: 2006/09/01
    ジャーナル フリー
    This paper proposes a method for fabricating size-varied structures from nanometer scale to millimeter scale on the same wafer precisely. The advancement in nanometer scale lithography and DRIE have enabled us to develop a lot of applications of high aspect ratio nano structures. However, DRIE conditions optimized for nanometer scale openings are often incompatible with large size openings due to the aspect ratio dependence of optimum conditions. Applying DRIE conditions optimized for small openings to large openings results in lots of silicon pillars in trenches. To solve the problem, this paper proposes a two-step etching method: the etching of nano-structures plus contours of large area patterns followed by the etching of the rest with optimum conditions respectively. The contours etching in the first step enabled us precise alignment of nano-patterns to large patterns. Its capability has been shown by successful fabrication of optical switches which are consisted of large etched areas and fine comb-drive actuators on a 4-inch 25 μm SOI wafer.
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