Various electrometers for measuring surface charges on insulating materials have known. In the study of electrophotographic films, however, the instrument must be capable of measuring accurately the rapid decay of surface potential during exposure to light.
From the point of view, electrometers utilizing electrostatic induction are of great value.
Some sort of vacuum tubes or MOS FET having extremely high input impedance are available for this purpose.
In this experiment an operational amplfier named μPC 152 is used for the electrometer input stage.
It has a nominal input impedance fo 10
13 (ohm) and shows a time constant of about 500 (sec) when connected with the senser electrode system. The surface potential of an electrophotographic film placed opposite to the electrometer probe is indicated on an X-Y recorder connected to μA 741, which amplifies the output of μPC 152. Caliblations is given using a standard electrode in the place of the test sample. Furthermore, the decay rate of surface potential during light exposure is recorded simultaneously with the ligth decay by differentiating the output of μA 741 electrically.
The mechanisms of photoconduction are discussed about test sample on the basis of effective photocurrent which is propotional to the surface voltage decay rate. The error due to finite input time constant and imperfect differentiation are calculated theoretically, showing that under the present measuring conditions their effects are negligible.
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