In recent years, it has become increasingly important to estimate the electromagnetic shielding effectiveness(SE) of the cases that enclose various types of electronic equipment. The FDTD method is well known to be one of the most useful numerical techniques for such problems. However, for the FDTD modeling, very fine cells must be used in the region with thin sheets, and these fine cells reduce the time-step size because of the CFL stability condition, which results in an increase in computational efforts. We previously proposed the ADI-FDTD method, which is unconditionally stable and free from the CFL stability condition restraint. In this report, the characteristics of the SE of various thin sheets are calculated using the ADI-FDTD method, and the results for this method are compared with results for the conventional FDTD method.
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