X-ray measurements have been performed on the development of in-plane and interplanar correlations of intercalated Ag atoms in stage-2 and stage-1 AgxTiS2 single crystals. In stage-2 compounds rodlike diffuse scattering pararell to the c* axis was observed, which indicated the two dimensional (2D) feature of this system. Below 250K, such a diffuse rod was modulated. This behavior apparently shows an enhancement of three dimensional nature. By analyzing rodlike diffuse scattering, 2D short range order parameters were determined. On the other hand, for stage-1, the modulation of the diffuse rod was already observed at room temperature.
A new type of Pendellösung Fringes due to X-ray Resonant Scattering (PFXRS) is observed for several reflections from GaAs and Ge. PFXRS is caused by a sharpe change in f' near the X-ray absorption edge. In this paper are described a condition for the observation of PFXRS, results of the measurement and a method for the determination of the f' from a modulation of PFXRS.
Recently, significant progress has been made in the field of magnetic Compton scattering experiment by using intense circularly polarized synchrotron radiation X-rays. Magnetic Compton profiles of Fe (+3%Si), Ni, Fe50Ni50, Fe50B20 amorphous, and Gd are reported, demonstrating the new and effective applicability of this method to the study of magnetism.
Condition of crystal and crucible rotation rates which offers unstable flow was revealed. It has been conventionally reported that iso-rotational condition of crystal and crucible has been thought to make stable flow from numerical simulation with assumption of axisymmetric and steady flow. However, it has become clear that the iso-rotational condition is not able to make stable flow from the present experiment. We also made it clear that the volume expansion coefficient of molten silicon should be order of 10-4 K while two different values of the constant such as 1.43×10-4 and 1.43×10-5 K had been previously reported.