日本結晶学会誌
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
57 巻 , 5 号
選択された号の論文の12件中1~12を表示しています
連載企画 産業界で活躍する結晶学
連載企画 SHELXL入門講座
解説
  • 波多 聰, 光原 昌寿, 中島 英治, 池田 賢一, 佐藤 和久, 村山 光宏, 工藤 博幸, 宮崎 伸介, 古河 弘光
    2015 年 57 巻 5 号 p. 276-284
    発行日: 2015/10/31
    公開日: 2015/10/31
    ジャーナル フリー
    Three-dimensionalization, i.e., direct representation or fabrication of three-dimensional (3D) objects, is now a key technology in various science and engineering fields. Electron microscopy, a vital nanoscale characterization tool, is no exception, thus various imaging methods have been developed to extend its imaging capabilities from conventional two dimensions to three dimensions. In this article, we focus on electron tomography (ET), which is a typical 3D imaging method using transmission electron microscopy (TEM) or scanning transmission electron microscopy(STEM), and overview the current status and future prospects of ET and an application of ET to 3D imaging of dislocations in crystalline materials as an practical example.
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