The background intensity of X-ray diffraction is affected by both of amorphous materials and co-existence elements. When the samples contain heavy elements, generally a background intensity decrease because of absorption effect, however it sometimes increase with fluorescent X-ray, for instance, Fe-K
α, β generate when a Fe contained sample is radiated by Cu-K
α.
In order to investigate the effect of amorphous silica and Fe
2O
3 on the background intensity, two kinds of samples were prepared, one was mixture of α-quartz, α-cristobalite and Fe-Si-gel (contain Fe
2O
3), another samples were natural quartzites. The investigation of these samples showed that the intensity of Fe-Ka, p increase according to diffraction angle 2θ, whereas the main peak of diffraction ring of amorphous silica is obserbed about 2θ=23°.
Thus amorphous silica and Fe
2O
3 show different effects on a distribution of background intensity, so it is possible to determine these contents from two background intensities of which 2θ are different. The high angle background in this paper is the value of 2θ=39.8° and the low angle is 22.8°. As the content of a-cristobalite has influence on the latter value, which is corrected with that content calculated by Xray diffraction method.
The results of above investigations are as follows.
1) The background intensities of 2θ=39.8° and 22.8° are both affected by the contents of Fe
2O
3 and amorphous silica, but the former mainly propotional to Fe
2O
3% and the latter to amorphous silica % respectively.
2) The relation between Fe
2O
3%, amorphous silica % and two background intensities can be expressed with the equation (1).
Fe
2O
3 %=A
1I
22.8+E
1I
39.3+C
1Amorphous silica %=A
2I
22.8+B
2I
39.8+C
2A
1-C
2; coefficients
I
22.8, I
39.8; back ground intensities
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