In order to elucidate the behavior of TiO
2 in the silicate melt which is well known as amphoteric oxide, infrared emission spectra were measured in the molten state of the Na
2O-TiO
2-SiO
2 system and were compared with the spectra measured in the glassy state including Raman scattering.
The results obtained from the
in situ measurement are as follows:
(1) Since the spectrum patterns in molten states are almost similar to those in glassy states, it is concluded that there is no essential difference in the silicate anions in the molten or glassy state.
(2) When TiO
2 is added to sodium silicates, two bands appear at 57000 and 33500 m
−1. The intensities of these bands increase proportionally with the TiO
2 content. They are assigned to the stretching mode (F
1u) and the bending mode (F
1u) of TiO
68− structure belonging to the point group symmetry O
h. Therefore, it is recognized that the Ti
4+ ion takes the octahedrally coordinated oxygens in the silicates.
(3) The ratio of the area of the Si-O
− (NBO) band to that of the total Si-O
− (NBO) and Si-O (BO) bands increases with increasing Na
2O or TiO
2 content in the melt. Therefore, it is concluded that both TiO
2 and Na
2O act as strong network modifiers in the silicate melt within the composition range measured.
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