The crystal structure and thermoelectric properties of Mn
1-xCr
xTe (0≤
x≤0.3) films prepared on glass substrates by vacuum evaporation were investigated. X-ray diffraction measurements showed that the solubility limit of Cr in the NiAs-type MnTe phase for Mn
1-xCr
xTe films is
x=0.06. For films in which 0≤
x≤0.06, the Neel temperature
TNopt, which was determined from the deflection point in the temperature dependence curve of the optical band gap, shifts strongly toward higher temperatures from
TNopt,=327 K (
x=0) to
TNopt,=460 K (
x=0.06) with an increase in
x. The Seebeck coefficient S of the films reaches a maximum around
TNopt, indicating that the enhancement of S can be attributed to the magnon-drag effect. On the other hand, for
x >0.06, the temperature at which S reaches a maximum does not change with
x, and S decreases markedly owing to the presence of a metallic Cr
2Te
3 phase.
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