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Volume 5, Issue 1
Displaying 1-6 of 6 articles from this issue
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Mitsuru Asanuma1981 Volume 5 Issue 1 Pages 1-5
Published: February 28, 1981
Released on J-STAGE: May 18, 2010
JOURNAL FREE ACCESSDownload PDF (1126K) -
Akira Tonomura1981 Volume 5 Issue 1 Pages 6-11
Published: February 28, 1981
Released on J-STAGE: May 18, 2010
JOURNAL FREE ACCESSElectron holography has recently made a remarkable progress due to the high coherence of an electron beam generated in a field emission electron microscope and almost reached the stage of practical reality.
Holographic interference electron microscopy was realized which gives information on magnetization distribution of specimen. Interference fringes in a contour map were proved to be along the in-plane magnetic lines of force when the thickness was uniform and the magnetic field was closed in the specimen.View full abstractDownload PDF (1380K) -
Sonoko Tsukahara1981 Volume 5 Issue 1 Pages 12-19
Published: February 28, 1981
Released on J-STAGE: May 18, 2010
JOURNAL FREE ACCESSContrasts of magnetic domain and domain wall images in Lorentz micrographs are reviewed for both films magnetized parallel and perpendicular to the film plane, and typical images are shown.
Various types of stripe domains are noticed in connection with the magnetization change in neighbouring two domains. It is common to the films with perpendicular anisotropy that a domain with parallel inplane magnetization can be devided into many stripe domains in which only the perpendicular components of magnetization change signs.
Frequently takes place the interchange of domain walls and domains with perpendicular component of magnetization, which is characteristic to the domain structure of thin films.View full abstractDownload PDF (2235K) -
Takaaki Yamamoto, Tadao Nozawa, Yukio Matsuo1981 Volume 5 Issue 1 Pages 19-28
Published: February 28, 1981
Released on J-STAGE: May 18, 2010
JOURNAL FREE ACCESSDomain observation is indispensable for studying the loss mechanism of grain-oriented 3% silicon-iron. The losses of this material are affected considerably by the conditions of steel surface, especially surface coating. The direct observation of domain patterns without surface polishing or removing of surface coating is necessary for studying the real magnetization process of this material
The domain observation method using SEM with a backscattered electron image is useful for studying the behavior of grain-oriented 3% silicon-iron, especially at high accelerating voltage where the coating can be penetrated to reveal the magnetic domain structure beneath. Dynamic domain patterns can be observed by SEM, also.View full abstractDownload PDF (2758K) -
Masaharu Kinoshita1981 Volume 5 Issue 1 Pages 28-35
Published: February 28, 1981
Released on J-STAGE: May 18, 2010
JOURNAL FREE ACCESSThe magnetic domain observation techniques using Scanning Electron Microscopy (SEM) is applied on the research of Mn-Zn ferrite materials. Scratching along [010] direction on (001) plane induces a local magnetic anisotropy parallel to [100] direction around scratch groove. Surface damage by abrasive processes causes a heavy influence on magnetic domain structure, which reaches to 300μm deep from the surface. The surface damage induced domain structure consists of fine 180°C walls array vertical to surface and zig-zag shaped 90°C walls. The reversible 180°C and 90°C domain walls displacements can be observed during continuous change of applied external force even as small as 0.7 N. Dynamic observation of 180°C domain wall displacement is also possible and the suppression of wall displacement can be observed at 60 kHz under 16 A/m magnetic field. The magnetic domain structure of combined crystal-structured ferrites is also investigated and a joint boundary between single- and polycrystals is revealed strain free.View full abstractDownload PDF (2090K) -
1981 Volume 5 Issue 1 Pages 52
Published: 1981
Released on J-STAGE: May 18, 2010
JOURNAL FREE ACCESSDownload PDF (136K)
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