The modified damage constant.
KL=(1/
Li2-1/
L02)•Φ
-1, is obtained from the drop rate of the photocurrent at 1.0μm monochromatic light irradiation, where the minority carrier diffusion length in the bulk region before γ-irradiation,
L0, is estimated by fitting the observed spectral response carve to those calculated with the diffusion length as parameter. The values
Li and Φ represent the minority carrier diffusion length after γ-irradiation, and the total flux of incident γ-ray photons, respectively. When N/P-type cells are contaminated with Cu, the values of
KL by about one order of magnitude compared with non-doped cells, while those of the P/N-type cell contaminated with either Cu or Ni ane only slightly smaller than when not doped. The
KL values of the pulled (C•Z) bulk P/N-type cell are about 1/2 those of the floating zone (F•Z) bulk cell. The curves of
KL of the non-doped F•Z and C•Z bulk P/N-type cell
vs. total dosage begin to decrease from a point below 10
16 photons/cm
2 total dose. Also, the damage constant,
K=(τ
i-1-τ
0-1)•Φ
-1, of n-type floating zone (F•Z) and pulled (C•Z) bulk P/N-type cells and of p-type C•Z bulk N/P-type cells, both γ-irradiated, is seen to increase with dopant concentration in the bulk region.
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