Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), which has an advantage that can acquire structural information of chemical species existing on very near surfaces of substances, is one of the most useful tools for surface analysis of organic materials. However, since TOF-SIMS measurements are normally carried out in high vacuum environment, in some cases, we have actually measured unwanted conditions differed from original surface states where one would like to obtain, or can not obtain reproducible results, due to so-called “vacuum damage”. In such cases, sample cooling technique provides an effective mean. In this report, some example about ToF-SIMS measurements on organic material surfaces are presented, reducing a "vacuum damage" and keeping reproducibility by using a sample cooling technique.

  Photoemission process leaves the target system in several final states that are lacking one electron with respect to the initial state. Except for the trivial noninteracting case, the final state effect leads to nontrivial features in the photoemission electron spectroscopy (PES). They are distinguished as the main feature and its satellites. In this issue, we discuss the satellite features in PES when the final state is reached by the extended excitations, that is, corresponding to the collective excitations of charges, spins, or vibrations. In particular, we focus on the basic PES problems of the metallic system with the Fermi sea of conduction electrons.