The AFM images and LEED patterns of clean surfaces of talc, phlogopite and muscovite are observed, in order to clarify the relationship between the AFM images and crystallographic arrangements of phyllosilicate surface atoms. The (001) surfaces of a native talc crystal cleaved in a pure argon atmosphere is placed in an AFM sample chamber with argon gas stream. Hexagonal rings of SiO4 tetrahedron with a distance of 2.8Å between O2-ions were clearly observed by AFM. For cleaved (001) surfaces of phlogopite and muscovite mica, two types (T and H) of AFM images are observed. The T-type image is similar to that of talc, whereas H-type AFM image shows residual K+ions on hexagonal network with a lattice distance of 5.2Å. This is interpreted that the position of residual K+ions is consistent with that of K+ions which are bound in the middle of hexagonal O2-ion channel in the SiO4 tetrahedron sheet. Interpretation of these AFM images are supported by the LEED patterns observed.
We have developed a handy, portable repair equipment using by micro-sputtering method, so that we can easily repair defects on coated glasses without removing them from the frame. This repair equipment is made up of a micro-sputtering apparatus to repair defects and a control unit to control the vacuum and electric system.