表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
33 巻 , 4 号
選択された号の論文の14件中1~14を表示しています
巻頭言
日本学士院賞受賞お祝い記事
特集:表面プラズモンとナノテクノロジー:プラズモニクス
論文
  • 清水 有子, 新川 隆朗, 津田 美幸, 佐々木 義和, 中田 宗隆
    原稿種別: 論文
    2012 年 33 巻 4 号 p. 242-246
    発行日: 2012/04/10
    公開日: 2012/04/22
    ジャーナル フリー
    A new matching method using Akaike's Information Criterion (AIC) is proposed to make one wide observation area of a specimen in high resolution from multiple images of Transmission Electron Microscope (TEM), where the TEM images are assumed to be due to Poisson distribution. This method is applicable to TEM images having large noises and then to specimens composed of light elements, which worsen the signal-to-noise (S/N) ratio. We applied this method to real TEM images of a glutamine synthetase as a demonstration and obtained satisfactory results quickly. A statistical method to evaluate optimum binning widths using AIC is also proposed to obtain better images. This method was applied to the real TEM images of silicon single crystal and found to prevent from highlighting the contrast of noises and from negatively affecting the results of image processing, implying that this new statistical method using AIC is a suitable approach for analyses of TEM images.
談話室
海外研究体験記
会議報告
先端追跡
feedback
Top