Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Volume 27, Issue 8
Displaying 1-4 of 4 articles from this issue
  • Fumio WATANABE
    1984 Volume 27 Issue 8 Pages 631-647
    Published: August 20, 1984
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
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  • Tatsuhiko MATSUSHITA, Akio SUZUKI, Masahiro OKUDA
    1984 Volume 27 Issue 8 Pages 648-657
    Published: August 20, 1984
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    Reversible structural change has been studied in a thin film system of parylene/GaxSe1-x/parylene structure in order to find a range of conditions for the crystallization, a crytical initialization for as-deposited film to become erasable optical memories. The influence of the illumination by a xenon lamp (photocrystallization) and the heat treatment (thermal crystallization) were analyzed mainly for the composition x = 0.05, using X-ray diffraction and XMA. Finely crystallized area with retaining an adequate surface smoothness, assigned as A-region, developed radially to form a circular crystals when treated at 210°C for 3 min. under the simultaneous illumination of 100 mW/cm2. Lower temperatures and more intense illumination levels were not suitable because of the formation of coarse grains with sharp grain boundaries, B-region. Repeated write/erase was possible for the sandwich structure, using a focused (2μφ) He-Ne laser with power levels of 3.75 mW for 2 ms for vitrification (transparent) and of 2.1 mW for 8000 ms for crystallization (absorbing), respectively. The A-region was found to be connected by scratching GaxSe1-x film with a sharp needle followed by a treatment for the A-type crystallization, which possibly enables us to provide a recording track on the surface, with better S/N ratios. The local stress caused by the scratch may be responsible for the nucleation of connected A-type crystals. It was also found that the film composition changed to become Se-rich on the scratch and deficient on both sides of the scratch.
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  • Hiroshi ADACHI, Kiyoshi FUJII, Shigeaki ZAIMA, Yukio SHIBATA, Shigeki ...
    1984 Volume 27 Issue 8 Pages 658-666
    Published: August 20, 1984
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    Field electron emission from TiC single crystals of <100> and <111> directions was examined. Very stable electron emission was observed when the crystals were flashed at a certain temperature. The current fluctuations due to the residual gas were also reduced. The flashing temperatures make changes in the emission patterns, which render the shapes of the top of the field emission tip. It is concluded that the surface near the top is constracted by (100) and (111) facets independently of the crystal orientations, and this conclusion is confirmed by the Fowler-Nordheim plot of the emission current.
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  • Naoto UCHIDA, Keiji ENPUKU, Keiji YOSHIDA, Fujio IRIE
    1984 Volume 27 Issue 8 Pages 667-677
    Published: August 20, 1984
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    Magnetic-flux trapping in Pb-alloy thin films is studied experimentally. In order to clarify pinning characteristics of thin films, which dominate flux trapping, trapped flux in Pb-alloy thin films is measured in-situ from the increment of the quasiparticle current of the Josephson junction made of these Pb-alloy thin films. Experimental results are discussed with the critical state model based on the pinning theory of superconductors. From the material dependence of flux trapping, it is shown that the addition of Au to Pb increases flux trapping due to the occurence of strong pinning centers of normal precipitates of AuPb2 and AuPb3 etc. It is also shown that the addition of Bi decreases flux trapping due to the large value of the London penetration depth of PbBi films. From the temperature dependence of flux trapping, it is shown that the amount of the trapped flux is reduced by raising the temperature of thin films. Finally, the effect of the trapped flux in junction electrodes on the suppression of the critical current of the junction is discussed quantitatively.
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