Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Volume 28, Issue 3
Displaying 1-5 of 5 articles from this issue
  • Katsuya NAKAYAMA
    1985 Volume 28 Issue 3 Pages 109-112
    Published: March 20, 1985
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
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  • Harushige KUROKAWA, Hideji SHIBATA
    1985 Volume 28 Issue 3 Pages 113-118
    Published: March 20, 1985
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
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  • Takashi OKADA, Katsumi UKAI, Tsutomu TSUKADA
    1985 Volume 28 Issue 3 Pages 119-124
    Published: March 20, 1985
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
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  • Yoshitaka FUJITA, Katsuhiro MIYAZAKI, Chiei TATSUYAMA
    1985 Volume 28 Issue 3 Pages 125-130
    Published: March 20, 1985
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    The mechanism of electrochromism of amorphous V2O5 thin films prepared by vacuum evaporation of V2O5 powder has been studied by optical absorption, XPS and SIMS measurements. The films are colored and bleached with an aid of electrolytic solution consisting of lithium percholorate (LiClO4·3H2O) in propylen carbonate (CH3CHOCOOCH2). The color of as grown films is yellow like V2O5 powder, while that of colored films is greenish gray like VO2 powder. The XPS spectra of O1s and V2p3/2 core levels of as grown films agree with those of V2O5 powder. On the other hand, the spectra of colored films are similar to those of VO2 powder. SIMS measurements reveal that Li+ ions are inserted into films in coloration and exhausted in bleaching. From these results, it is concluded that the coloration of a-V2O5 films is due to a change of molecular state of V2O5 into VO2. This change is caused by a double injection of electrons and Li+ ions into films.
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  • Hamao OKAMOTO, Masaharu OSHIMA, Nobue MINEGISHI
    1985 Volume 28 Issue 3 Pages 131-134
    Published: March 20, 1985
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    Auger electron spectroscopy of insulator polyimide films has been studied from the viewpoint of discharging effect in order to facilitate surface analysis of contact hole formed by Ar laser beam irradiation. Polyimide surface was found to become conductive by electron bombardment. The conductive layer formation is easily observed by SEM absorption image, and is found to be slightly lack of imide bonding. By means of the conductive layer and evaporated Al pattern, Auger analysis with high energy electron beam and high incident angle was accomplished without charging-up phenomena.
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