Perovskite-type manganites have various electronic and magnetic properties by changing their compositions and temperature. It is known that an La
0.6Sr
0.4MnO
3 thin film has a half metallic property, which is expected for the application to magnetic tunneling junctions. To obtain a yield rate of a TMR device accompanied with high-performance of a TMR effect, a single magnetic domain should be made in a La
1-xSr
xMnO
3 thin film. Photoelectron emission microscopy (PEEM) is a powerful tool to directly perform spatial mapping of magnetic domains, combining with using synchrotron radiation beam. We can obtain useful images in terms of a element-selective electronic structure and/or a magnetism.
We have performed the direct observation of magnetic domain structures on the microstructures of the La
0.6Sr
0.4MnO
3 thin films using photoelectron emission microscope with synchrotron radxation in order to clarify their magnetic domain formations. The magnetic domain formation depends on a subtle balance between the step-induced uniaxial anisotropy and the shape anisotropy. We reveal that a cooperative effect between the step-induced uniaxial and shape anisotropies makes a single magnetic domain in a patterned LSMO thin film on the micron scale. On the contrary, the competitive effect generates a multi-magnetic domain.
This findings provides useful information on the improvement of TMR devices in La
1-xSr
xMnO
3 thin films epitaxialy fabricated on a substrate with step structures.
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