An equation for calculating the standard deviation (s. d.) σ
IB of the integral breadth I
B of an X-ray diffraction line is derived analytically. The s. d. (σ
IB represents the size of the variation in I
B which ; attributable to counting statistics. The trapezoidal and Simpson's rules give the same results for both I
B andσ
IB the trapezoidal rule is recommended because it makes for easier calculation. The s. d. σ
IB is given by σ
IB=R/((R-1)√(y
p))√(1/(2R)(nc-I
B)
2+I
B2) (1) where R is the ratio of peak to background of the diffraction line, y
p is the maximum count, n is the number of data points minus 1, and c is a step width. The s. d. σ
IB agreed closely with the sample standard deviation obtained in 70 repetitive measurements of I
B. This shows that the s. d. of I
B can e obtained from a single measurement by using Eq. (1).
抄録全体を表示