The Review of Laser Engineering
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
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Volume 26, Issue 9
Displaying 1-11 of 11 articles from this issue
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  • [title in Japanese]
    Eizi HIROTA
    1998 Volume 26 Issue 9 Pages 655
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.655
    JOURNAL FREE ACCESS
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  • Nondestructive Inspection and Diagnosis by Lasers
    Satoru TOYOOKA
    1998 Volume 26 Issue 9 Pages 656-657
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.656
    JOURNAL FREE ACCESS
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  • A Speckle-lnterferometry-Based Method of Deformation Analysis and Fracture Prediction for Solid-State Materials
    Sanichiro YOSHIDA
    1998 Volume 26 Issue 9 Pages 668-671
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.668
    JOURNAL FREE ACCESS
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    Adeformation analysis method capable of predicting the timing and location of a fracture is introduced. This method measures the in-plane displacement of the sample and makes diagnoses based on a recent theory of plastic deformation. The prediction of a fracture is made by observing a specific optical pattem representing strain localization or analyzing the temporal characteristics of the displacement field. The theoretical basis is described and the performance of the methodis demonstrated for tensile analyses of aluminum-alloy samples. In principle, this method is applicable to any solid-state material that has an inner-structure.
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  • Analysis of Multiple Layers of Transparent Objects Using a Confocal Microscope with Low-Coherence Interferometer
    Takashi FUKANO, Ichirou YAMAGUCIII
    1998 Volume 26 Issue 9 Pages 672-676
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.672
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    In industrial applications, thickness and refractive index measurements of transparent plates and films are very important for quality control. For these purposes, several methods using lightwaves are available for noncontact and nondestructive measurement. However, because the refractive index and geometrical thickness are always correlated to each other, the separation of these two quantities is required for accurate inspection. In this review, we explain the principle and the apparatus for separate measurement of the refractive index and the geometrical thickness applicable to multiple layers. Several applications of this method are also described.
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  • Application of Laser Beams to Nondestructive Measurement of Residual Stress in Semiconductor Devices
    Hideo MIURA
    1998 Volume 26 Issue 9 Pages 677-681
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.677
    JOURNAL FREE ACCESS
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    Effective methods of applying laser beams to measure residual stress in semiconductor devices are briefly presented. Surface curvature measurement of a film-deposited substrate is known to be effective for measuring internal stress of thin films. Oblique Incidence Ellipsometry using a rotating analyzer can detect residual stress in polymer and glass films. Since polarization of an incident beam varies with the internal stress of the film, residual stress in the film can be measured by detecting the phase shift of the transmitted or reflected beam. The minimum resolution of this stress measurement using this method is about 10 kPa. Microscopic Raman spectroscopy is useful for measuring residual stress in semiconductor substrates such as silicon and gallium-arsenide. The peak position of the Raman spectrum shifts linearly with an applied uni-axial stress, and the stress sensitivity of this method is about 250 MPa/cm-1. Thus residual stress in the semiconductor substrates can be determined by detecting the shift in the spectrum. The minimum laser beam spot size obtained in this report was about 0.4 μm when a ultraviolet laser beam with 300-nm wavelength was used.
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  • Diagnostic Technologies Using Optical Fibers
    Kazunori NAKAMURA
    1998 Volume 26 Issue 9 Pages 682-686
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.682
    JOURNAL FREE ACCESS
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    This article describes diagnostic technologies using optical fibers for large scale constructions and life-lines in the civil engineering field. Because of their low transmission loss, fiber sensing technologies are highly effective for monitoring a series of long objective, such as gas and oil pipe lines or power and communication cable lines. In addition, the Optical Time Domain Reflectometry (OTDR) method and the newly developed fiber devices of Fiber Bragg Grating and Fiber Fabry-Perot interferometer provide us many applications for diagnostic requirements.
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  • Measurement of Magnetic Parameters Based on the Dynamic Motion of a Magnetically Suspended Pellet for Laser Fusion
    Hiroki YOSHIDA, Susumu TANASE, Yukio SAKAGAMI
    1998 Volume 26 Issue 9 Pages 687-690
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.687
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    In laser-fusion experiments, it is important to maintain a uniformity of implosion. A magnetically suspended pellet (MSP) has been studied to provide a contact-free fuel pellet at the firing position. It is suspended against the gravitational force by an electromagnet in which the current is controlled in response to the positionvelocity of the MSP. In the present study, the magnetic shape coefficient Km and specific permeability μm are determined from an analysis of the vertical dynamic motion.
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  • Luminescence Properties of Nd3+ and Yb3+ Complexes in Organic Solvents for Liquid Laser Medium
    Jeong Ho KIM, Nobuaki NAKASHIMA, Yasuchika HASEGAWA, Yuji WADA, Shozo ...
    1998 Volume 26 Issue 9 Pages 691-695
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.691
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    Perdeuterated hexafluoroacetylacetonato-neodymium [Nd (HFA-D) 3] and -ytterbium [Yb (HFA-D) 3] complexes were synthesized by the keto-enol tautomerism reaction of Nd (HFA-H) 3 and Yb (HFA-H) 3 in methanol-d4 in order to reduce the radiationless transition to the ligands. The luminescence properties of the Nd (HFA-D) 3 complex in organic solvents were analyzed by the Judd-Ofeltheory. The luminescence quantum yield of the Yb (HFA-D) 3 complex increased with the increasing coordination ability of the solvent molecules. The luminescence lifetime of the Yb (HFA-D) 3 complex in dimethylstilfoxide (DMSO-d6) which had the highest coordination ability was 66 μs.
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  • Development of High-Power γ-Ray Source by Compton Scattering
    Ahsa MOON, Masayuki FUJITA, Naoya NAKAO, Kazuo IMASAKI, Nobuhisa OHIGA ...
    1998 Volume 26 Issue 9 Pages 696-699
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.696
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    We have investigated the Compton scattering of an intense laser beam confined to the supercavity for a highenergy and high-bright photon source. To generate the scattered photons in high efficiency, it is necessary to collide high-density electrons with high-density photons. Therefore, the laser light and the electron beam should be focused as small as possible to get intense radiation. But the focused laser beam and electron beam cannot overlap with each other completely. Here we describe a method for an electron beam and laser beam to interact under optimal conditions in a realistic case. Using this method, we can estimate the flux of γ-ray 1012 photons/sec for a conventional laser with a supercavity and typical electron storage ring.
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  • Spectral Sensitivity Calibration of a Back-Illuminated CCD Using a Laser-Plasma X-Ray Source
    Daisuke OHNUKI, Hiroaki NISHIMURA, Hiroyuki DAIDO
    1998 Volume 26 Issue 9 Pages 700-704
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.700
    JOURNAL FREE ACCESS
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    The spectral sensitivity of a back-illuminated charge-coupled device (CCD) was absolutely calibrated in the energy range of 0.1-1.1 keV. The x-ray from a laser produced plasma was monochlomatized with an x-ray spectrograph, and was detected simultaneously with the CCD and an x-ray diode of known sensitivity. The calibration method and results are presented including spectral images of laser plasmas as examples of possible applications.
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  • The Technical Bases of Lasers: I
    For Applications in Science and Technology
    Sadao NAKAI
    1998 Volume 26 Issue 9 Pages 705-708
    Published: September 15, 1998
    Released on J-STAGE: August 25, 2010
    DOIhttps://doi.org/10.2184/lsj.26.705
    JOURNAL FREE ACCESS
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