Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
Volume 20, Issue 3
Displaying 1-11 of 11 articles from this issue
  • TATSUO ARIKAWA, TAKAYASU MOCHIZUKI, GIITI IWATA
    1972 Volume 20 Issue 3 Pages 167-172
    Published: September 30, 1972
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
    An integral expression of the classical deflection function by the use of Mellin transformation has been presented, which is convenient for the differentitation with respect to the impact parameter b to give the relation between the rainbow scattering angle θ R and the reduced kinetic energy K of the incident particle. A simple and useful approximate formula, -θ R⋅K=0.29 γ+1.75, valid for the value of K not less than five, has been derived for the three-parameter(12, 6, 4)potential.
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  • MITSURU TSUBOI, SHIN'YA SAIDA, HISASHI YAMAZAKI, MASAO INOUE, AYAO AME ...
    1972 Volume 20 Issue 3 Pages 173-184
    Published: September 30, 1972
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
    Construction of an ion cyclotron mass spectrometer is reported. The apparatus has been built with electromagnet and analyzer cell Varian Associates and is similar to that described by Beauchamp, Anders and Baldeschwieler. Details of the spectrometer are described. The theory of ionci motion in the analyzer cell is presented in order to compare with performance of the spectrometer. The instrument is sensitive to as few as ten ions in the analyzer cell and a resolution has been found to be about 1, 100 at m/e 84 with the resonance frequency of 153 kHz. Half-width at half maximun of the collision-broadened absorptin line of N2+ in their parent gas has been measured as a function of pressure and the collision cross section and ion mobility of N2+ have been calculated as 210±30Å 2 and 1.83±0.30 cm2/V·sec, respectively.
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  • YOSHIO UEDA, JUN OKANO
    1972 Volume 20 Issue 3 Pages 185-195
    Published: September 30, 1972
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
    A sputtering mass spectrometer with a cesium primary ion source was constructed. Two types of the surface ionization ion source for producing the cesium ion beam were made and their characteristics were studied. The second type of the source, which had two filaments in the ionization chamber, proved to have the superior performances. The beam current of 0.5-2.0×10-7 A was obtained for more than 50 hours. The diameter of the beam on the surface of the target was about 0.45mm.By using cesium ions as the primaries, the charge up effect due to the ion bombardment of insulating materials was much reduced, and the stability of the secondary ion current was enough for accurate analysis. Results of the preliminary measurements for the isotopic abundance ratio of lithium in the potassium alum crystal were described. The possibility of the high sensitive analysis of negative secondary ions was pointed out.
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  • YASUJI KOYAMA, KOGORO MAEDA
    1972 Volume 20 Issue 3 Pages 197-204
    Published: September 30, 1972
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Technical and practical problems are discussed in combining the ion-pulse counting method with a quadrupole mass filter. To eliminate the interference of high frequency voltage applied to the quadrupole rods, an appropriate combination of time constant values was chosen for the CR-RC circuit in the linear amplifier of an usual counting system. Tests with a selected combination have shown that extremely low ion currents less than 1-0.1 counts per sec(cps) are possible to be measured with a background counts around 0.02-0.05 cps. With this measuring condition, residual gas analysis of 10-7 Torr can be made by using only 10-11 amp. of electron bombarding currents. Some other interesting results which were obtained with the low bombarding currents are also described.
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  • HOKOTOMO INOUYE, KENICHI NIURAO
    1972 Volume 20 Issue 3 Pages 205-210
    Published: September 30, 1972
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Some conditions necessary for correctly measuring ion beam profiles by a transverse electric field are described. The most important is uniformity of the field. Gain uniformity on the first dynode surface of an electron multiplier used as the detector is also important. Fringing field effect can be safely ignored. The way of deducing the original profile by deconvolution of the measured intensity distribution curve proved to be satisfactorily accurate.
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  • REISUKE GENSHO, SETSUKO TAKEUCHI, MASATAKE HONDA
    1972 Volume 20 Issue 3 Pages 211-222
    Published: September 30, 1972
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
    Mass spectrometric determinations for trace amounts of radioactive 54 Mn and 53Mn in the presence of 55Mn have been studied. Both 54Mn and 53Mn are readily produced by nuclear reactions. Absolute amounts of each isotope could be obtained from the disintegration rate of 54Mn and the isotope ratios of 54Mn to the others. In order to find suitable experimental conditions in the isotope ratio, measure ments, a commercially available“ carrier-free 54Mn” was used as the sample.
    The manganese fraction was extracted from the sample containing 107 dpm of 54Mn and was puri fied for our mass spectrometric measurements by a wet chemical method. A silica gel method was applied for the solid source surface ionization and a pulse-counting method was improved to measure the extremely weak ion beam current. In one run about 1011 atoms of 54Mn could be determined with a high reproducibility in the presence of about 1014 atoms of 55Mn. Furthermore, coexisting 53Mn at the level of 10 10 atoms could also be detected with about±10%error.
    This method has been applied to determine the production cross-sections of 54Mn and 53Mn induced in a cyclotron-irradiated iron target.
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  • SHIGERU IKUTA, KENJI YOSHIHARA, TAKANOBU SHIOKAWA
    1972 Volume 20 Issue 3 Pages 223-228
    Published: September 30, 1972
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
    Fragmentation of cycloalkanes after charge exchange with various positive ions has been studied by using a double mass spectrometer, TOHOKU CS. Applicability of the MO theory proposed by Hirota et al. was investigated to the distribution of fragment ions for various impacted energies to the parent molecules. The theory was, however, not always fit to the experimental results in our present study. From comparison of the fragment ion distribution between n-pentane and cyclopentane, the frag mentation mechanisms which can explain the present results are proposed.
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  • GONYA TAKAHASHI, AKIRA KATO
    1972 Volume 20 Issue 3 Pages 229-237
    Published: September 30, 1972
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Data are given of the mass spectra of 3-methylcholanthrene, one of the strongest carcinogenic hydrocarbons, and some related compounds. The structures of their fragments are shown speculatively.
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  • MITSURU NAKAYAMA, SHIZUKO EGUCHI, AKIHIKO MATSUO, SHÛICHI HAYASH ...
    1972 Volume 20 Issue 3 Pages 239-247
    Published: September 30, 1972
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Mass spectra of pterocarpan derivatives (I∼VII) are recorded in Figs. 1∼5 and Tables 1∼6. The major fragmentation pathways of these compounds are shown in Scheme1. The results illustrate that the observed fragmentation patterns are of considerable utility in the application of mass spectro metry to structure elucidation in this series.
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  • TATSUO ARIKAWA, TAKAYASU MOCHIZUKI
    1972 Volume 20 Issue 3 Pages 249-251
    Published: September 30, 1972
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
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  • NORIAKI KISHIMA
    1972 Volume 20 Issue 3 Pages 253-254
    Published: September 30, 1972
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
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