Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
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Volume 28, Issue 1
Displaying 1-3 of 3 articles from this issue
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ORIGINAL PAPERS
  • Semi-quantitative Analysis of Fragmentation Processes of Ethylene Ion by Modified Extended Hückel Method
    Takashi Matsuo, Isao H. Suzuki, Kogoro Maeda
    1980 Volume 28 Issue 1 Pages 75-83
    Published: 1980
    Released on J-STAGE: May 01, 2007
    DOIhttps://doi.org/10.5702/massspec.28.75
    JOURNAL FREE ACCESS
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    For the theoretical study of fragmentation processes to produce acetylene ion, a modified extended Hückel method was presented, where the explicit inclusion of repulsive potential was intended between the two nuclei. The potential curves were calculated for possible fragmentation processes, direct detachment of a hydrogen molecule and detachment of the molecule after scrambling of hydrogen atoms, in order to obtain the required barrier energies. The results showed that the scrambling process through the asymmetric structure required the lowest energy, that is, the most probable process is the scrambling. This is compatible with the experimental results reported previously.
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  • Merging Beams Apparatus for Studying Ion-neutral Reactions.
    Shigeo Hayakawa, Akira Matsumoto, Teruo Hayakawa
    1980 Volume 28 Issue 1 Pages 85-92
    Published: 1980
    Released on J-STAGE: May 01, 2007
    DOIhttps://doi.org/10.5702/massspec.28.85
    JOURNAL FREE ACCESS
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    A new merging beams apparatus has been designed by which both the mass and energy of the product ion could be analyzed simultaneously. The apparatus is advantageous to investigate the two-body collision dynamics which has various channels associated with different product ions. The details of the instrument are described. The energy distributions of the product ions for the reaction H2++H2→H3++H were measured. The comparison with some previous measurements indicates that the apparatus performs satisfactorily.
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  • Analysis of Cr, Si and C in Steel by SIMS with the New Epuipments
    Tetsuro Ishizaki, Hifumi Tamura, Atsushi Shibata, Mitsunori Tamai
    1980 Volume 28 Issue 1 Pages 93-101
    Published: 1980
    Released on J-STAGE: May 01, 2007
    DOIhttps://doi.org/10.5702/massspec.28.93
    JOURNAL FREE ACCESS
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    We have developed a new type of SIMS (IMA-2AS) which incorporates total ion monitor, secondary ion energy analyzer and turbo molecular pumps. We propose a new method for adjusting the trajectory of secondary ion beam in the mass spectrometer. That is the combination method of total ion monitoring and secondary ion energy analysis.
    By this method, we measured secondary ion intensities of Cr, Si and C in sieel. From the experimental results, it has been proved that the C.V.% of secondary ion intensities were reduced to about 20~50%. So, we could define the effect of experimental conditions and changes in Cr content of samples to the secondary ion intensities.
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