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Volume 55, Issue 1
Displaying 1-12 of 12 articles from this issue
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Fumio INABA1986 Volume 55 Issue 1 Pages 1
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Satoshi KAWATA1986 Volume 55 Issue 1 Pages 2-23
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Kitao FUJIWARA1986 Volume 55 Issue 1 Pages 24-35
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Tatsuhiko YAMANAKA1986 Volume 55 Issue 1 Pages 36-45
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Masaaki KUBOTA1986 Volume 55 Issue 1 Pages 47-48
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Seiji SUZIJKI, Tatsuro HAYASHI1986 Volume 55 Issue 1 Pages 49-50
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Noriyoshi CHUBACHI, Jun-ichi KUSHIBIKI1986 Volume 55 Issue 1 Pages 51-55
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Shigeo MINAMI1986 Volume 55 Issue 1 Pages 56-62
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Totaro IMASAKA1986 Volume 55 Issue 1 Pages 63-67
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
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Shigero IKEDA, Toru TAKAYAMA1986 Volume 55 Issue 1 Pages 68-72
Published: January 10, 1986
Released on J-STAGE: February 20, 2009
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Kohji MIZOGUCHI, Sinichi NAKASHIMA, Yasuo INOUE, Michihiro MIYAUCHI, A ...1986 Volume 55 Issue 1 Pages 73-80
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
JOURNAL FREE ACCESSA scanning Raman microprobe consisting of a Raman spectrometer and a scanning microscope was constructed. Under the best condition, the focal spot size on a sample surface was 0.7μm at λ0=488nm. Two-dimensional Raman intensity profiles of CW-laser annealed polycrystalline silicon films were measured with this apparatus, and the grain size of the polycrystalline films was estimated. Moreover, the crystallographic orientations of the grains were determined from the Raman polarization measurements.View full abstractDownload PDF (658K) -
[in Japanese]1986 Volume 55 Issue 1 Pages 81
Published: January 10, 1986
Released on J-STAGE: February 09, 2009
JOURNAL FREE ACCESSDownload PDF (97K)
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