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Akio SASAKI
1988 Volume 57 Issue 5 Pages
657
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Makoto ISHIDA, Tetsuro NAKAMURA
1988 Volume 57 Issue 5 Pages
658-667
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Shiro USUI, Hiroo YONEZU
1988 Volume 57 Issue 5 Pages
668-678
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Ienari IGUCHI
1988 Volume 57 Issue 5 Pages
679-685
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Hiroaki OHNISHI, Naoki YOKOYAMA
1988 Volume 57 Issue 5 Pages
686-690
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Tetsu SUZUKI, Koji MIZUNO
1988 Volume 57 Issue 5 Pages
691-696
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Yasuhiko ARAKAWA, Takuji TAKAHASHI
1988 Volume 57 Issue 5 Pages
697-702
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Masahiro ASADA
1988 Volume 57 Issue 5 Pages
703-707
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Kazuhisa UOMI
1988 Volume 57 Issue 5 Pages
708-713
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Minoru YAMADA
1988 Volume 57 Issue 5 Pages
714-719
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Takeo ICHINOKAWA
1988 Volume 57 Issue 5 Pages
720-722
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Masanori ABE, Manabu GOMI
1988 Volume 57 Issue 5 Pages
723-737
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Yasuhiro TANAKA, Masaaki SUNOHARA, Tadao SHIOYAMA, Masaaki UEDA, Yoshi ...
1988 Volume 57 Issue 5 Pages
755-756
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Hisami NISHI
1988 Volume 57 Issue 5 Pages
757-758
Published: May 10, 1988
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Kenya GOTO
1988 Volume 57 Issue 5 Pages
759-761
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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Tadashi KOJIMA
1988 Volume 57 Issue 5 Pages
762-764
Published: May 10, 1988
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Ryosuke KONISHI, Yasuhiro KOBAYASHI, Hiroshi SASAKURA
1988 Volume 57 Issue 5 Pages
765-773
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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We have measured surface extended electron-energy loss fine structure (SEELFS) and extended appearance potential fine structure (EAPFS) on evaporated Ti film, amorphous TiFe film and polycrystalline graphite and studied their surface structures. In the case of titanium, the result of SEELFS for the final state angular momentum ι=2 is in good agreement with the nearestneighbour atomic spacing of bulk titanium. This result shows that the dipole selection rule is satisfied. The analysis of EAPFS with ι=2 also gives a reasonable atomic spacing and indicates that the excitation to ι=2 is dominant though the dipole selection rule is not generally valid for EAPFS. Nearest-neighbour atomic spacing obtained from SEELFS and EAPFS are 0.293±0.006 nm and 0.287±0.005 nm, respectively. We applied the same analysis to the SEELFS and EAPFS of amorphous TiFe film, assuming the dipole selection rule, and obtained the nearest-neighbour atomic spacing of 0.253±0.005 nm from SEELFS and 0.257±0.004 nm from EAPFS. In the case of graphite, the analysis of SEELFS and EAPFS with ι=1 gives C-C distance of 0.136±0.005 nm and 0.134±0.004 nm, respectively.
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Katsuyuki KINOSHITA, Kazunori SHINODA, Yoshiji SUZUKI
1988 Volume 57 Issue 5 Pages
774-783
Published: May 10, 1988
Released on J-STAGE: February 20, 2009
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During the development of a synchroscan streak tube, a multipactor discharge which much increases background noise on the output screen has occurred. The relationships between the discharge and the operating conditions, the manufacturing process of the tube and the tube construction have been investigated. It has been found that the discharge can be prevented by adding a shield electrode near the deflection electrode. The developed tube is compact and easy to operate because it has low accelerating voltage of 5 kV and high deflection sensitivity of 50 mm/kV
p-p. The spectral response covers over a range from 200 nm to 850 nm. It can be operated over wide sweeping frequencies ranging from 80 MHz to 160 MHz and the temporal resolution of _??_8ps has been obtained at 80 MHz. Moreover, it is very highly sensitive because a microchannel plate is incorporated and high speed gating is available by switching the applied voltage of the plate.
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Osamu NAKAMURA, Satoshi KAWATA, Shigeo MINAMI
1988 Volume 57 Issue 5 Pages
784-791
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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A new theory for analyzing the three dimensional imaging characteristics of optical microscopes is proposed. This theory is based on the first-order Born approximation, including diffraction limitation, the dispersion equation of optical wave, and Bragg condition. 3-D spatial-frequency bands are derived by the proposed theory for the conventional microscopes of coherent, incoherent, and fluorescence types. For the confocal microscopes of transmission and fluorescence types, precise 3-D OTFs are derived. The following results are found by examining the derived OTFs: 1) A confocal transmission microscope has the same 3-D imaging characteristic as the conventional incoherent microscope. 2) The longitudinal resolving power of a confocal fluorescence microscope is higher than any type of conventional or confocal microscopes. This microscope does not have the “missing cone” in its 3-D OTF space. 3) The lateral spatial-frequency band of a confocal fluorescence microscope is twice as wide as a fluorescence microscope with uniform illumination.
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Kazuo NOGUCHI, Nobuo SUGIMOTO, Hiroshi SHIMIZU
1988 Volume 57 Issue 5 Pages
792-795
Published: May 10, 1988
Released on J-STAGE: February 09, 2009
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The transmission character of the cesium vapor blocking filter for the high spectral resolution lidar was investigated using a narrow band dye laser pumped by an excimer laser. The dependence of the measured absorption band width of the filter on the operational temperature agrees with the theoretical calculation. The result shows that the secium vapor filter has the spectral charactor most suitable for the high spectral resolution lidar.
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