Journal of The Japanese Society for Quality Control
Online ISSN : 2432-1044
Print ISSN : 0386-8230
Search
Advanced search
OR
Browse
Search
Volume 15, Issue 3
Displaying 1-11 of 11 articles from this issue
Show all abstracts
    • |<
    • <
    • 1
    • >
    • >|
Article
Tutorial
Contributed Paper
  • On validity of the beta-binomial model for process defectives
    Hisakazu SHlNDO, Osamu NAKANO, Ken-ichi SHIMURA, Tadashi YOSHIZAWA
    Article type: Contributed Paper
    1985 Volume 15 Issue 3 Pages 44-51
    Published: July 15, 1985
    Released on J-STAGE: March 01, 2019
    DOIhttps://doi.org/10.20684/quality.15.3_44
    JOURNAL RESTRICTED ACCESS
    Show abstractHide abstract
    The beta-binomial model for process defectives is shown to be valid in some actual product lines by analysing the samples of total size about 90, 000, which were observed in some cosmic product lines. This model has been suggested to be effective to describe the variation of fraction defective within a group as well as to describe the states in mixing of solid particles. The negative binomial model, which approximates the beta-binomial model in the case of small fraction defective, is also tested with the same data.
    View full abstract
    Download PDF (646K)
Technical Note
Forum
Case Method
    • |<
    • <
    • 1
    • >
    • >|
feedback
 Top