The Journal of Reliability Engineering Association of Japan

Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697

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Volume 18, Issue 7

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[title in Japanese]

Article type: Cover
1996 Volume 18 Issue 7 Pages Cover1-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_Cover1

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[title in Japanese]

Article type: Appendix
1996 Volume 18 Issue 7 Pages i-iii
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_i

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[title in Japanese]

Article type: Index
1996 Volume 18 Issue 7 Pages iv-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_iv

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[title in Japanese]

[in Japanese]

Article type: Article
1996 Volume 18 Issue 7 Pages 527-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_527

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[title in Japanese]

[in Japanese]

Article type: Article
1996 Volume 18 Issue 7 Pages 528-534
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_528

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Article type: Article
1996 Volume 18 Issue 7 Pages 535-539
Published: November 10, 1996
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DOIhttps://doi.org/10.11348/reajshinrai.18.7_535

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[title in Japanese]

[in Japanese]

Article type: Article
1996 Volume 18 Issue 7 Pages 540-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_540

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[title in Japanese]

[in Japanese]

Article type: Article
1996 Volume 18 Issue 7 Pages 541-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_541

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[title in Japanese]

Article type: Appendix
1996 Volume 18 Issue 7 Pages 542-543
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_542

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[title in Japanese]

Article type: Appendix
1996 Volume 18 Issue 7 Pages 544-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_544

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[title in Japanese]

Article type: Appendix
1996 Volume 18 Issue 7 Pages 545-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_545

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[title in Japanese]

Article type: Appendix
1996 Volume 18 Issue 7 Pages 546-547
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_546

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[title in Japanese]

Article type: Appendix
1996 Volume 18 Issue 7 Pages 548-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_548

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[title in Japanese]

[in Japanese]

Article type: Article
1996 Volume 18 Issue 7 Pages 549-552
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_549

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Article type: Article
1996 Volume 18 Issue 7 Pages 553-556
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_553

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese]

Article type: Article
1996 Volume 18 Issue 7 Pages 557-560
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_557

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Article type: Article
1996 Volume 18 Issue 7 Pages 561-564
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_561

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Article type: Article
1996 Volume 18 Issue 7 Pages 565-568
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_565

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Article type: Article
1996 Volume 18 Issue 7 Pages 569-572
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_569

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Article type: Article
1996 Volume 18 Issue 7 Pages 573-576
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_573

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Article type: Article
1996 Volume 18 Issue 7 Pages 577-580
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_577

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Article type: Article
1996 Volume 18 Issue 7 Pages 581-584
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_581

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Article type: Article
1996 Volume 18 Issue 7 Pages 585-588
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_585

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Article type: Article
1996 Volume 18 Issue 7 Pages 589-592
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_589

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Article type: Article
1996 Volume 18 Issue 7 Pages 593-596
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_593

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Article type: Article
1996 Volume 18 Issue 7 Pages 597-600
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_597

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Article type: Article
1996 Volume 18 Issue 7 Pages 601-604
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_601

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Corrosion of Al-pattern on IC appears earlier than abnormarities in its input-and-output characteristics. Therefore, it is reasonable to check the corrosion in order to catch the tendency of degradation of electronic equipments as early as possible. Then we did a fundamental study to adopt the amount of the corrosion as a diagnotic parameter. As the result, we found the time-dependence of corrosion and a relationship between corrosion and failure. These characteristics can be applied to degradation diagnosis.

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Article type: Article
1996 Volume 18 Issue 7 Pages 605-608
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_605

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Article type: Article
1996 Volume 18 Issue 7 Pages 609-612
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_609

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Article type: Article
1996 Volume 18 Issue 7 Pages 613-616
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_613

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Article type: Index
1996 Volume 18 Issue 7 Pages 617-619
Published: November 10, 1996
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DOIhttps://doi.org/10.11348/reajshinrai.18.7_617

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Article type: Appendix
1996 Volume 18 Issue 7 Pages 620-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_620

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[title in Japanese]

Article type: Index
1996 Volume 18 Issue 7 Pages Toc1-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_Toc1

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The Reliability of The Adjacent Triangle : F Triangular Lattice System

Hisashi Yamamoto, Masami Miyakawa

Article type: Article
1996 Volume 18 Issue 7 Pages 97-105
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_97

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We consider the system consisting of components located on some triangles. This system fails if and only if three components on a triangle fail. This system is called by an adjacent triangle : F triangular lattice system. Our purpose is to propose a useful method for the reliability of the adjacent triangle : F triangular lattice system. For our purpose, we consider a linear connected-(2,(1,2))-out-of-(m, n) : F lattice system. It is shown that the adjacent triangle : F triangular lattice system can be expressed as the linear connected-(2,(1,2))-out-of-(m, n) : F lattice system. We propose a useful method for the reliability of the linear connected-(2,(1,2))-out-of-(m, n) : F lattice system. Some numerical examples are shown.

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Use of the Pulse Splitting Method to Improve Thermal Head Reliability

Susumu Shibata

Article type: Article
1996 Volume 18 Issue 7 Pages 106-112
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_106

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In the thermal recording systems using a thin film thermal head, high reliability of the resistors at high printing speeds can be achieved by the pulse splitting method which lengthens effective pulse width without changing the duty, furthermore the relationship between reliability and the pulse splitting conditions has been clarified.

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HARDWARE and SOFTWARE APPROACH for IDDQ TEST

Hisashi Yamauchi, Masaaki Yoshida, Toshinobu Ono, Kazuo Wakui, Yoshita ...

Article type: Article
1996 Volume 18 Issue 7 Pages 113-120
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_113

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IDDQ test based on pattern selection has began for 0.6um and 0.5um CMOS gate array series. Current free structure has been introduced for all functional macro cells of these series. Precise IDD measurements are realized by current flow cut for pull-up and pull-down buffers using test pads at wafer level testing. IDDQ test using variable threshold, calculated by a CAD tool from circuit conditions, is applied to package level testing. This hardware and software combination achieves high defect coverage with no customer penalty.

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[title in Japanese]

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Article type: Article
1996 Volume 18 Issue 7 Pages 121-127
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_121

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As life estimation methods for waterproof LCD used for outdoor meters, environmental accelerated life tests in high temperature, low teperature and high humidity were conducted. Besides, temperature and humidity in the outdoor meter under test were measured and conditions in actual usage were estimated in order to predict the meter life. Since the required life of outdoor meters was 10 years, 20 years of life was aimed and it is estimated that the LCD satisfy the life requirement in the field. Owing to the above test methods, an estimation method of life in the field was conducted.

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[title in Japanese]

Article type: Cover
1996 Volume 18 Issue 7 Pages Cover2-
Published: November 10, 1996
Released on J-STAGE: March 02, 2018

DOIhttps://doi.org/10.11348/reajshinrai.18.7_Cover2

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