The Journal of Reliability Engineering Association of Japan

Volume 35, Issue 8

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[title in Japanese]

Article type: Cover
2013 Volume 35 Issue 8 Pages Cover1-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_Cover1

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages i-vi
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_i

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[title in Japanese]

Article type: Index
2013 Volume 35 Issue 8 Pages ix-x
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_ix

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[title in Japanese]

Article type: Index
2013 Volume 35 Issue 8 Pages xi-xii
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_xi

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Safe

Mitsuyoshi FUKUDA

Article type: Article
2013 Volume 35 Issue 8 Pages 421-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_421

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Dependability of VLSI Systems : A Review of a JST CREST Program(1. Overview,<Special Survey>Dependable VLSI System)

Shojiro Asai

Article type: Article
2013 Volume 35 Issue 8 Pages 423-424
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_423

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 425-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_425_1

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 425-426
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_425_2

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2.1 Ionizing Radiation Induced Soft-Error and Dependability of Electronic Systems(2. Radiation-Induced Soft Errors,<Special Survey>Dependable VLSI System)

Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Takumi Uezono, Hitoshi Tani ...

Article type: Article
2013 Volume 35 Issue 8 Pages 427-428
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_427

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2.2 Radiation-Hard Flip-Flops(2. Radiation-Induced Soft Errors,<Special Survey>Dependable VLSI System)

K. Kobayashi, M. Masuda, R. Yamamoto, J. Furuta, H. Onodera

Article type: Article
2013 Volume 35 Issue 8 Pages 429-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_429

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2.3 Design Automation for Reliability(2. Radiation-Induced Soft Errors,<Special Survey>Dependable VLSI System)

Hiroto YASUURA, Yusuke MATSUNAGA, Masayoshi Yoshimura, Makoto SUGIHARA

Article type: Article
2013 Volume 35 Issue 8 Pages 430-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_430

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2.4 Soft Error Tolerant Reconfigurable Architecture(2. Radiation-Induced Soft Errors,<Special Survey>Dependable VLSI System)

Yukio MITSUYAMA, Takao ONOYE, Hiroyuki OCHI, Kazutoshi WAKABAYASHI

Article type: Article
2013 Volume 35 Issue 8 Pages 431-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_431

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2.5 Soft-Error Tolerant SRAM Cell Layout(2. Radiation-Induced Soft Errors,<Special Survey>Dependable VLSI System)

Hiroshi KAWAGUCHI, Shusuke YOSHIMOTO, Shunsuke OKUMURA, TAKURO Amashit ...

Article type: Article
2013 Volume 35 Issue 8 Pages 432-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_432

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 433-435
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_433

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 436-437
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_436

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3.1 Outline of Electromagnetic Environmental Noise in VLSI Circuits(3. Electromagnetic Noises,<Special Survey>Dependable VLSI System)

Makoto Nagata

Article type: Article
2013 Volume 35 Issue 8 Pages 439-440
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_439

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3.2 Power Noise and Immunity of SRAM(3. Electromagnetic Noises,<Special Survey>Dependable VLSI System)

Makoto Nagata, Kumpei Yoshikawa, Noriyuki Miura

Article type: Article
2013 Volume 35 Issue 8 Pages 441-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_441

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3.3 Dependability of Real-time Communication Responsive Link for Distributed Control(3. Electromagnetic Noises,<Special Survey>Dependable VLSI System)

Nobuyuki Yamasaki, Masayuki Inaba

Article type: Article
2013 Volume 35 Issue 8 Pages 442-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_442

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 443-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_443

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 444-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_444

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4.1 Performance Variability(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)

Hidetoshi ONODERA

Article type: Article
2013 Volume 35 Issue 8 Pages 445-446
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_445

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4.2 Monitoring and Compensation of Performance Variation(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)

Hidetoshi ONODERA

Article type: Article
2013 Volume 35 Issue 8 Pages 447-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_447

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4.3 Variation-Tolerant Circuit Technology(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)

Masahiro GOSHIMA, Shuichi SAKAI

Article type: Article
2013 Volume 35 Issue 8 Pages 448-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_448

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4.4 Dependable ADC Technology(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)

Akira MATSUZAWA, Masaya MIYAHARA

Article type: Article
2013 Volume 35 Issue 8 Pages 449-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_449

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4.5 Fine Grain Assist Bias Controlled SRAM(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)

Koji NII, Makoto YABUUCHI, Hidehiro FUJIWARA, Hirofumi NAKANO, Hiroyuk ...

Article type: Article
2013 Volume 35 Issue 8 Pages 450-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_450

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4.6 Highly Accurate Delay Time Measurement by an On-Chip Circuit(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)

Yukiya MIURA, Yasuo SATO, Seiji KAJIHARA

Article type: Article
2013 Volume 35 Issue 8 Pages 451-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_451

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4.7 Canary Flip-Flop(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)

Toshinori SATO, Ken Yano, Hiroto YASUURA

Article type: Article
2013 Volume 35 Issue 8 Pages 452-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_452

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 453-454
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_453

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 455-456
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_455

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5.1 Time Dependent Degradation(5. Time-Dependent Degradation in Device Characteristics,<Special Survey>Dependable VLSI System)

Takashi SATO, Masanori HASHIMOTO

Article type: Article
2013 Volume 35 Issue 8 Pages 457-458
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_457

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5.2 A Dependable Processor Covers Transient / Permanent Fault by Self Reconfiguration(5. Time-Dependent Degradation in Device Characteristics,<Special Survey>Dependable VLSI System)

Hajime SHIMADA, Jun YAO

Article type: Article
2013 Volume 35 Issue 8 Pages 459-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_459

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5.3 Highly Reliable Signal Processing Technologies for Flash Memory(5. Time-Dependent Degradation in Device Characteristics,<Special Survey>Dependable VLSI System)

Ken Takeuchi

Article type: Article
2013 Volume 35 Issue 8 Pages 460-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_460

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5.4 Field Test Role for Danger of Physical Degradation(5. Time-Dependent Degradation in Device Characteristics,<Special Survey>Dependable VLSI System)

Yasuo SATO, Seiji KAJIHARA

Article type: Article
2013 Volume 35 Issue 8 Pages 461-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_461

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5.5 A Reconfigurable Architecture for Dependable Cache(5. Time-Dependent Degradation in Device Characteristics,<Special Survey>Dependable VLSI System)

Masahiko YOSHIMOTO, Yohei NAKATA, Yuta KIMI, Jinwook Jung, Hiroshi KAW ...

Article type: Article
2013 Volume 35 Issue 8 Pages 462-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_462

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 463-464
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_463

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 465-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_465

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6.1 Challenges for Dependable Public Wireless Systems(6. Connectivity,<Special Survey>Dependable VLSI System)

Fumiyuki ADACHI

Article type: Article
2013 Volume 35 Issue 8 Pages 467-468
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_467

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6.2 Dependability Issues of System Interconnect(6. Connectivity,<Special Survey>Dependable VLSI System)

Tadahiro KURODA

Article type: Article
2013 Volume 35 Issue 8 Pages 469-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_469

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6.3 Dependable Air(6. Connectivity,<Special Survey>Dependable VLSI System)

Kazuo TSUBOUCHI, Suguru KAMEDA, Akinori TAIRA, Noriharu SUEMATSU, Tada ...

Article type: Article
2013 Volume 35 Issue 8 Pages 470-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_470

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6.4 Reliability Issues in 3D-LSI(6. Connectivity,<Special Survey>Dependable VLSI System)

Mitsumasa KOYANAI, Hiroaki KOBAYASHI, Toshinori SUEYOSHI, Tadashi KAMA ...

Article type: Article
2013 Volume 35 Issue 8 Pages 471-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_471

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6.5 Non-Contact Data and Power Transfer(6. Connectivity,<Special Survey>Dependable VLSI System)

Hiroki ISHIKURO

Article type: Article
2013 Volume 35 Issue 8 Pages 472-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_472

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6.6 Applications of Non-Contact Interconnect(6. Connectivity,<Special Survey>Dependable VLSI System)

Tadahiro KURODA

Article type: Article
2013 Volume 35 Issue 8 Pages 473-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_473

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 474-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_474

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 475-476
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_475

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[title in Japanese]

Article type: Appendix
2013 Volume 35 Issue 8 Pages 477-478
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_477

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7.1 Dependability Issues in Hard Real-Time Control(7. Responsiveness,<Special Survey>Dependable VLSI System)

Yoshihiro NAKABO, Masatoshi ISHIKAWA

Article type: Article
2013 Volume 35 Issue 8 Pages 479-480
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_479

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7.2 Real-Time Processing of D-RMTP : The SoC for Distributed Control(7. Responsiveness,<Special Survey>Dependable VLSI System)

Nobuyuki Yamasaki

Article type: Article
2013 Volume 35 Issue 8 Pages 481-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_481

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7.3 Asynchronous Networks-on-Chip(7. Responsiveness,<Special Survey>Dependable VLSI System)

Tomohiro YONEDA, Masashi IMAI

Article type: Article
2013 Volume 35 Issue 8 Pages 482-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_482

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7.4 Multifunction NoC Router Architecture(7. Responsiveness,<Special Survey>Dependable VLSI System)

Kenji KISE

Article type: Article
2013 Volume 35 Issue 8 Pages 483-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_483

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7.5 Dependable Wireless RFIC Technologies(7. Responsiveness,<Special Survey>Dependable VLSI System)

Minoru FUJISHIMA

Article type: Article
2013 Volume 35 Issue 8 Pages 484-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_484

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