Perfluoroalkylated polystyrenes (PS t-C
nF
2n+1, ;
n=6, 7) having various fluoroalkylation ratios (Rf ratio) were prepared using perfluoroalkanoyl peroxides (C
nF
2n+1 (CO) OO (CO) C
nF
2n+1 ;
n=6, 7). The surface characteristics of polystyrene films were studied by contact angle measurement and X-ray photoelectron spectroscopy (XPS). Critical surface tension (γ
c ) of polystyrene films decreased with an increase in Rf ratio in the begining, and then remained constant above a certain Rf ratio (above 16% in
n=6). γ
c also decreased with the increase in the number of carbon, n, before reaching constant at
n=6. XPS analysis revealed that surface fluorine concentration increased in the beginning with increasing Rf ratio and was saturated at the same Rf ratio (16% in
n=6). It was also found that the surface fluorine concentration increased with increasing number of carbon, n, and then remained constant above n=6
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