This study deals with thermogravimetry-differential thermal analysis (TG-DTA) and powder X-ray diffractometery (XRD) of the Sri Lankan-type vein graphite. The Sri Lankan-type vein graphite is well-known for its high purity with up to 95–98% of carbon content. It is thought that this vein-type graphite had been deposited from mantle-derived fluids. One of the largest vein-type graphite deposits of Sri Lanka occurs at Kahatagaha, in high-grade metamorphic rocks. Graphite crystals in these veins have grown mostly perpendicular to the wall rocks with at least four different textural types.
TG-DTA analysis is an effective tool for the distinction of graphitic material. This method can precisely measure simultaneously the difference in temperature between a sample and a standard and the rate of weight loss during combustion.
Basal spacing
d (002) and width of
d (002) spacing at half height of the peak for the four types of graphite crystals were measured by XRD. Crystal thickness along c-axis of crystallites in angstroms, denoted by Lc (002), was calculated using these graphitization parameters.
XRD results for the four types of graphite in a single vein show that the graphite crystals have identical fully-crystalline structure. However, TG-DTA data show variations in different peak temperatures and peak areas for the four different types of graphite crystals. We suspect that these variations are due to minor structural changes of graphite during progressive depositional process within a single vein.
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