Changes in Young's modulus, electrical resistivity, and bending strength of IG-11 graphite in the directions parallel to and perpendicular to compressive prestress were measured.From the results, a model for compressive deformation of polycrystalline graphite was proposed.
The electrical resistivity in the direction parallel to the loading axis decreased with increase in compressive prestress up to 0.4 σ
f, where σ
f denotes the average compressive strength, 80 MPa, of the graphite.Then it increased abruptly with increasing the prestress to above 0.4 σ
f, whereas that in the direction perpendicular to the loading axis increased over the whole prestress level.Young's modulus in the direction parallel to the loading axis was unchanged with increase in the prestress up to 0.4 σ
f and it decreased abruptly above 0.4 σ
f, whereas that in the direction perpendicular to the axis decreased with increase in the prestress up to 0.4 σ
f and decreased slightly above 0.4 σ
f.Bending strength in the direction parallel to the loading axis increased with increase in the prestress up to 0.4 σ
f and decreased above 0.4 σ
f, whereas the strength in the two directions perpendicular to the loading axis unchanged up to 0.2 σ
f thereafter those decreased abruptly.
A model was proposed for compressive deformation mechanism of polycrystalline graphite: In the case of low compressive stress pore and/or microcracks on the basal plane perpendicular to the loading axis in the grain would be shrunk or closed.On the basal plane parallel to the loading axis formation of microcracks would occur because of plastic flow in the direction perpendicular to the loading axis.On removal of compressive stress tensile stress is expected to be generated on account of release of elastic strain around the grains which are deformed plastically in the loading direction.The tensile stress naturally produces many cleavage microcracks on the basal plane perpendicular to loading axis.This model is supported by mercury porosimetry which showed micropores with around 1μm diam. increased with increase in the prestress.
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