This paper focuses on the latest research of switching arc both in vacuum and SF₆ substitutes in our group. The crucial characteristics of vacuum arc are illustrated, including the motion and distribution of single cathode spot and multiple cathode spots, the influence of axial magnetic field on arc plasma characteristics, the influence of composite magnetic field on cathode jets, and the study of anode activities. Meanwhile, the arc characteristics in SF₆ and its substitutes (Ar, CO₂ and N₂) at different pressures and gap distances are investigated by experiments and simulation.

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This paper develops a methodology of crosstalk analysis/measurement techniques for the design and fabrication of the MEMs (Micro-ElectroMichanical system) probe card. By introducing more ground pins into the connector pins, the crosstalk characteristics can be enhanced and a design guide for the parameters, such as pin's size and pitch is proposed to satisfy the given crosstalk limitation of -30dB for reliable high speed signal transfer. The paper also presents a novel method to characterize scattering parameters of multiport interconnect circuits with a 4-port VNA (Vector Network Analyzer). By employing the re-normalization of scattering matrices with different reference impedances at other ports, data obtained from 4-port configuration measurements can be synthesized to build a full scattering matrix of the DUT (Device-Under-Test, MEMs probe connector pins). In comparison to the conventional 2-port VNA re-normalization method, proposed technique has two advantages: saving of measuring time, and enhanced accuracy even with open-ended un-measured ports. A good agreement of the estimated and correct S parameters verifies the validness of the proposed algorithm.

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The authors have been investigating degradation process of Au plated slip ring and Ag-Pd-Cu brush system. In almost all cases the lifetime of the sliding system ends, when Au plating layer is worn out, the ring surface is oxidized to be black in color and contact resistance becomes very high. Further, the lifetime is very short without lubricant. So, the lubricant is very effective to make the lifetime longer. However, even with lubricant the lifetime is varied from about 1000 hours to almost 7000 hours in the past experiments. It is an important issue how the lubricant works on the lifetime of the system. In this paper the effect of lubricant on the degradation process of contact resistance is focused on. In the past tests the lubricant is supplied only once before the test. In this test the lubricant is regularly supplied almost every 900 operation hours. Consequently, the operation more than 8000 hours is realized, which is the longest among tests so far. In addition the contact voltage drop increase gradually until 2600 hours and after that it stays almost constant around 70mV. According to the Element Analysis after the test the Ni base plating layer is totally exposed in many tracks. It means that the Au plating layer is gradually worn out probably at the stage of increasing voltage drop. In the previous tests the lifetime ended even when the Ni plating layer remained. So, the reason of long operation in this test is guessed to be that the lubricant not only decreases wear of ring and brush, but also suppresses oxidation of the Ni layer.

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Tin (Sn) contacts are widely applied to connector contacts. Surfaces of plated tin layer are covered with an oxide film that results in high contact resistance. However, it is possible to obtain low contact resistance by using high contact load. Current downsizing trends often make it difficult to obtain high contact loads. Therefore, it is important to conduct basic studies of the contacts resistance characteristics under low contact load conditions. In this study, relationships between contact resistance and the changes of contact traces were examined. When a platinum (Pt) hemisphere contacted to tin plated flat coupon, it was found that the hemisphere surface sank into the softer tin plated flat surface during loading resulting in a piling up tin crystal grains along the periphery of the contact trace. During this process, sudden decrease in contact resistance was observed. To clarify the phenomenon, morphology changes of contact traces were observed by AFM, SEM and EBSD. FEM analysis was also used to analyze the mechanical stress distribution in the tin plated layer. Due to the peculiar distribution of stress, the crystal grains are separated and push out the contact area. This phenomenon is very different from commonly observed decrease in contact resistance due to elastic and plastic deformation inducing mechanical fracture of the surface oxide film.

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Application of transverse magnetic field (TMF) is one of the most important ways to improve electric life and breaking capacity of DC relays. For better understanding of dependence of arc durations on transverse magnetic field, a series of experiments were conducted under an external transverse magnetic field with 12 pairs of AgSnO₂ contacts in a DC 28V 60A/30A/5A circuit, respectively. By using permanent magnets, the transverse magnetic field was obtained and the magnetic flux density at the gap center was varied from 13 to 94mT. The results show that breaking arc duration is decreased monotonically with increases in the magnetic flux density, but making arc duration isn't decreased monotonically with increases in the magnetic flux density. In addition, both the magnetic flux density and the breaking arc duration have threshold values B_l and T_bmin, respectively, which means the breaking arc duration is almost stable with the value T_bmin even if the magnetic flux density is higher than B_l.

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The circuit switching device by the electrical contact needs the high reliability and long lifetime. The very important factor for the high reliability, long lifetime and electromagnetic noise of the electrical contact is to suppress the duration and electromagnetic noise of arc discharge. Usually, the suppression of arc duration method is applying the external magnetic field. But, this method was not able to suppress the metallic arc duration and increased the voltage fluctuation at arc duration. Therefore, the new method for suppressing the duration and noise for electrical contact is expected. In this paper, a new method for suppressing duration and EM noise of arc discharge by applying housing pressure is proposed. To investigate the availability of proposed method, the measurement and some considerations on arc duration, voltage-fluctuation and current noise up to GHz frequency band generated by breaking contact in the applied pressure relay housing are reported. Firstly, voltage waveform and duration of the arc are measured. The effects of the pressure in the relay housing on the duration of the metallic and gaseous phase arcs are discussed. Secondary, voltage fluctuation, the spectrogram of contact voltage and current noise up to GHz frequency band are discussed. In the results, the proposed method with applying pressure makes shorter both durations of metallic and gaseous phases. The shorter duration of metallic phase is an advantage of the proposed method beyond the applying external magnetic field. As the housing pressure is increase, the voltage fluctuation and current noise becomes smalls. The proposed method can suppress the voltage fluctuation as well as arc duration. Consequently, the proposed method is on of the good solution to suppress the duration and electromagnetic noise of the arc discharge from electrical contact and result of this study indicates the basic considerations necessary to ensure good lifetime and EMC designs for electrical contacts.

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Arc discharge generated by breaking electrical contact is considered as a main source of not only degradation of the electrical property but also an undesired electromagnetic (EM) noise. In order to clarify the effect of heated temperature on the bridge, arc-duration and the fluctuation of voltage, opening-waveforms at slowly separating silver-tin dioxide contact with holder heating are measured and discussed experimentally in this paper. Firstly, opening-waveforms are measured. Secondly, voltage fluctuation of the each arc-phase is discussed to extract the effect of the heated holder. The relationship between temperature of the heated holder and duration and fluctuation of the arc was investigated experimentally. It was revealed that as the initial temperature of the heated holder becomes higher, arc-duration becomes slightly longer. In addition, voltage fluctuation at the gaseous-phase decreases when the holder is heated. Consequently, the heated holder can suppress the voltage fluctuation even if its duration becomes slightly longer.

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A loosened connector between interconnected electric devices causes an increase in electromagnetic radiation when the devices operate in high-frequency bands. To develop a high-frequency circuit equivalent to a connector with contact failure, we previously investigated the parasitic elements caused by failure at the contact boundary. From the results of that study, the inductance and resistance at a connection contact boundary are increased by the loosening of a connector. Furthermore, the increase in inductance is the dominant factor in increasing the intensity of the electromagnetic radiation. In this paper, to suppress electromagnetic radiation resulting from a loose contact, we formulate the contact performance requirement needed to maintain a good contact condition when a small loosening has occurred at the interconnection. To this end, we investigate the mechanism of increase in the inductance by loosening the connector.

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In this paper, a contactless measurement technique of passive intermodulation (PIM) using a coaxial tube excited with standing waves is proposed. The principle of the proposed method is described using a two-port network model with the lumped resistances representing the losses of a specimen and test equipment. To show its validity, a test using nickel wires producing high PIM is carried out, and its PIM-dependency on DUT-position in the coaxial tube is simulated using the FDTD method. The simulated result shows a good agreement to the experiment. Through the examination, it is found that the power consumption by the PIM source in a specimen is essential in PIM production, and sensitive PIM detection does not require good matching condition. Finally, the relation between PIM-source size and generated PIM level is also examined. The result shows that at least 18dB-PIM reduction is obtained by PIM source size in a half-wavelength conductive wire.

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Silver electrical contacts are separated at constant speed and break arcs are generated in a DC100V-450V/10A resistive circuit. The transverse magnetic field of a permanent magnet is applied to the break arcs. Dependences of the arc duration, arc dwell time and arc lengthening time on the strength of the magnetic field and supply voltage are investigated. The characteristics of the re-ignition of the break arc are also discussed. Following results are shown. The arc duration D is increased due to the increase of the arc lengthening time t_m when the supply voltage E is increased for each magnetic flux density B_x, because the arc dwell time t_s is almost constant. The arc duration D is increased due to the increase of both of the arc lengthening time t_m and the arc dwell time t_s when the magnetic flux density B_x is decreased. The arc lengthening time tended to become long when the re-ignition of the break arc is occurred. The lengthening time tends to become longer when the duration t_m1 from the start of the arc lengthening to the start of the re-ignition is increased. Re-ignitions occurred frequently when the magnetic flux density of the transverse magnetic field is increased and the supply voltage is increased.

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Break arcs are rotated by the radial magnetic field formed by a magnet embedded in the pipe-shaped cathode. The arcs are generated in switching a DC42V resistive circuit. The closed contact current varies from 5A to 21A. The curvature of the anode surface is varied to study the dependence of the arc length and the positions of the break arcs in the contact gap. The following results are obtained: (i) as current decreases, there is more difference in arc duration among different curvatures; (ii) as current decreases, the arc duration decreases with decrease o f the radius of curvature; (iii) in each contact curvature, the anode spots region is located nearer to the center axis than the cathode spots region; (iv) the arc length just before arc extinction is independent of the curvature of the contacts.

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Break arcs are generated in a DC48V and 10A resistive circuit. The external transverse magnetic field of a permanent magnet is applied to the break arcs. The position and shape of the break arc are investigated. As a result, it is confirmed that the cathode spot region was shifted upward earlier than the anode spot region. This result shows that the cathode spot region is easily driven by the transverse magnetic field than the anode spot region.

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Experiments were carried out at several voltages to clarify the influence of the voltage on various characteristics, i.e. arc duration, contact resistance, arc energy, and the change in electrode mass. The voltage was varied from DC100V to 160V, the load current was fixed at 5A constant, and the electromagnetic contactor was operated continuously up to 100,000 times. The experiments were carried out under the three operation modes which are classified by the arc discharge. As a result, the relation between the operation mode and contact resistance was clarified. When only a make arc was generated, the contact resistance was smallest. In addition, the contact resistance was not affected by the source voltage.

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An injection locked coupled push-push 3-oscillators array using unilateral coupling circuits is proposed. The circuit consists of unit oscillators and coupling circuits. For the unit oscillator, a dual-band push-push oscillator which generates the fundamental signal (f₀) and the second harmonic signal (2f₀) is adopted. The output signal of the oscillator array is the second harmonic signal. The fundamental signal is used for the injection signal to synchronize oscillators. These adjoining unit oscillators are connected by the coupling circuits. The coupling circuit is composed of a buffer amplifier and a phase shifter. Due to the advantage of the push-push oscillator, the phase shift between the adjoining oscillators is twice as large as that of the phase shift in the coupling circuit. The oscillator array is designed in Ku-band. Three push-push oscillators are arrayed and include two coupling circuits which are designed and fabricated. The phase shift of 190.0 degrees between the adjoining unit oscillators is demonstrated.

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This paper presents a response time acceleration technique in a high-gain capacitive-feedback frontend amplifier (FA) for high output impedance sensors. Using an auxiliary amplifier as a unity-gain buffer, a sample-and-hold capacitor which is used for band-limiting and sampling the FA output is driven at the beginning of the transient response to make the response faster and then it is re-charged directly by the FA output. A condition and parameters for the response time acceleration using this technique while maintaining the noise level unaffected are discussed. Theoretical analysis and simulation results show that the response time can be less than half of the case without the acceleration technique for the specified settling error of less than 0.5%.

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3dB bandwidth enhancement of single mode semiconductor lasers is confirmed numerically and experimentally when they are operated by intensity modulated signal light injection. 3dB bandwidth is enlarged to 2.5 times of resonant frequency. The numerical analysis of rate equations predicts that the bandwidth enhancement is accomplished by the modal gain control of semiconductor lasers with injected intensity modulated signal light through non-linear gain coefficient term.

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Based on a reverse converter algorithm derived from the New Chinese Remainder Theorem I, an algorithm for sign detection of RNS {2ⁿ-1, 2ⁿ, 2ⁿ+1} is presented in this paper. The hardware of proposed algorithm can be implemented using two n-bit additions and one (n+1)-bit comparator. Comparing with the previous paper, the proposed algorithm has reduced the number of additions used in the circuit. The experimental results show that the proposed circuit achieves 17.3% savings in area for small moduli and 10.5% savings in area for large moduli on an average, with almost the same speed. The power dissipations obtain 12.6% savings in average.

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