ITE Technical Report
Online ISSN : 2433-0914
Print ISSN : 0386-4227
Volume 15, Issue 29
Displaying 1-9 of 9 articles from this issue
  • Article type: Cover
    1991 Volume 15 Issue 29 Pages Cover1-
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
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  • Article type: Index
    1991 Volume 15 Issue 29 Pages Toc1-
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
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  • Takanori SATOH, Akira TOMONO, Fumio KISHINO
    Article type: Article
    1991 Volume 15 Issue 29 Pages 1-6
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
    In this paper,we measure an allowable delay time with motion parallax by . means of quantitative method, which evaluates the effect of delay time according to the task by means of a device for 3-D manipulation in virtual space. We also present a method to generate CG images at high speed in the allowable time. The method is to select from a database of different detailed models, one model based on the distance between the viewpoint and object.
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  • Takeshi AGUI, Masayuki NAKAJIMA, Kenichi IDE
    Article type: Article
    1991 Volume 15 Issue 29 Pages 7-12
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
    In fieldes of commercial designs or simulations of scenes, it is often required to move or remove some indicated objects from natural images. Usually, a layout scanner is used for these operations, in which the operations are executed manually, so it takes much time. To decrease such operations, automatic extraction and paint system is useful. In the present paper, we propose a simple and fast method for automatic extraction of linear objectes, and show the experimental resultes applied to several natural images.
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  • Toshi MINAMI
    Article type: Article
    1991 Volume 15 Issue 29 Pages 13-18
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
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  • K. SHINOHARA, T. MINAMI
    Article type: Article
    1991 Volume 15 Issue 29 Pages 19-24
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
    A difinition of a color edge on the L'a'b'-uniform color space is given, and simultaneous probability of luminance edges and color edges of natural images and pictue images is studied experimentaly.
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  • Yukihiko YAMASHITA, Hidemitsu OGAWA
    Article type: Article
    1991 Volume 15 Issue 29 Pages 25-30
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
    optimum image restoration filter is a filter which minimizes or maximizes some objective function. There are close relations between those optimum image restoration filters and generalized inverses of operators. These relations help us to understand optimum restoration filters and generalized inverses of operators. This paper clarifies t hat optimum filters such as the projection filter and the averaged Projection filter become generalized inverses of the degraded operator under some restrictions. It is slso shown that the wiener filter behaves like a generalize inverse to some specific set of images, In order to discuss above problems, we introduce the notion of Pseudo-projection operators which minimize mean square error.
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  • Yasuhiko NUMAGAMI, Osamu NAKAMURA, Toshi MINAMI
    Article type: Article
    1991 Volume 15 Issue 29 Pages 31-36
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
    An automatic defect inspection algorithm for characters printed on chip resistors is described in this paper. Three characters representing electric resistance are usually printed on chip resistors. Though automatic defect inspection systems for printed circuits have already been developed, the quality of the characters printed on chip resistors is still examined by visual inspection. An automatic quality inspection system for the characters printed on such small chip resistors is required. This paper describes quality inspection algorithm based on the fuzzy theory obtained from ambiguous criteria for judgement which have been adopted in visual inspection. With an experiment using 70 chip resistors, 90.3% accuracy in the identification is obtained.
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  • Article type: Appendix
    1991 Volume 15 Issue 29 Pages App1-
    Published: May 23, 1991
    Released on J-STAGE: October 06, 2017
    RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS
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