In order to analyze the threshold of photoelectron yield spectroscopy (PYS) automatically, we compared the accuracy of the analysis between a fitting (least squares method) method and a machine learning method.
Both methods are comparable in terms of the performance of analysis, but machine learning shows better performance in data with high noise components.
In the analysis of measured Au data, machine learning shows close to the analyzed value by an analyst, but the fitting method shows the different value due to the influence of a high signal intensity.
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