Kelvin Probe Force Microscopy (KPFM) is a noncontact variant of atomic force microscopy (AFM) used to measure contact potential difference (CPD) between a probe tip and a sample surface. The sample’s surface potential or work function can be extracted from the measured CPD. Since the surface potential relates to many surface functionalities, KPFM has diverse applications in advanced material and device research. For the quantitative nanoscale measurement of surface potential by KPFM, it is essential to establish the standard protocol using suitable reference materials (RM). This international pre-standardization research via the Versailles Project on Advanced Materials and Standards (VAMAS) aims to establish a practical protocol for quantitative surface potential measurements at the nanoscale. Based on the VAMAS project achievements, the final goal is to develop an international standard through the International Organization for Standardization (ISO).

Sandwich freeze-drying, a unique and novel technique, offers a new way to create an aggregate-free, high-density dispersion of nanoparticles on a silicon substrate, perfect for microscopy. All you need is a freeze-dryer and an －80℃ freezer. If you can prepare a suspension in water, the precise nature of the particles is no longer a concern. This article will introduce the technique's history, mechanisms, and outcomes, piquing your curiosity. The scheme of sample preparations with sandwich freeze-drying and atomic-force microscopy measurements could provide comprehensive particle statistics, even in the case of a wide particle-size distribution. It even detected the Ostwald ripening of a bimodal mixture of spherical silica nanoparticles, a feat that would be challenging with other measurement methods.

Reliable method of surface roughness measurement with atomic force microscope is developing for industrial applications, such as nano-devices, precision optical devices. Variation of probe apex is one of the major problems for morphology measurement. To solve the problem, AFM image restoration with two or more probe is one of the possible solutions for accurate roughness measurement. This method is developing for international document standard.

The work of preparing International Standards in near-field scanning optical microscope (NSOM), which is a form of scanning probe microscope (SPM), is carried out through the Sub-committee No. 9 of Technical-committee No. 201 in international organization for standardization (ISO/TC201/SC9). Though the spatial resolution of NSOM is significantly superior to that defined by the Abbe diffraction limit, the definition of “true” optical spatial resolution of it is rather complex. To make International Standards of the spatial resolution in aperture-type NSOM, we had to develop the calibration methods and the reference materials for it, firstly. Here, we show the process of the standardization of NSOM which has already been concluded as ISO document, and also show the progress of recent works about the standardization of NSOM in ISO/TC201/SC9.

The current status and future prospects of international standardization of terminology, sample handling and data formats in international standardization on SPM are presented. As these standards are the basis for all standards on SPM, they were developed as a priority when ISO/TC 201 and ISO/TC 201/SC 9 were established, so many of them are old and need to be revised in line with the times. The terminology and sample handling have been gradually revised in line with new analytical methods, etc. However, regarding data formats, the rapid pace of technological progress requires data formats based on new concepts and various proposals have been made. The standardization and dissemination of data formats that meet the needs of different users, such as analysts, purchasers of surface analysis services and data scientists, is highly anticipated.

Quantitative measurement of frictional force by atomic force microscopy requires converting the output voltage signal of photo-detector into force using the torsional spring constant of cantilever and the lateral sensitivity of photo-detector. Various calibration methods have been proposed. This paper reviews the useful experimental calibration methods.

This paper describes the international standardization activities of ISO/TC201/SC9/WG7, including the standardized method and a new method currently undergoing international round-robin testing for local elastic modulus measurement using atomic force microscopy, future prospects including extension to viscoelastic measurement. This paper will also include examples of how the local elastic modulus measurement method can be utilized in the materials industry.