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  • 川勝 英樹, 佐谷 大輔, 小林 大, ダミ
    ロン
    デニス
    生産研究
    2015年 67 巻 5 号 559-563
    発行日: 2015/09/01
    公開日: 2015/10/05
    ジャーナル フリー
    The paper reports on heterodyne laser doppler interferometry and photothermal excitation applied to Atomic Force Microscopy. The combination of the above mentioned interferometry and excitation methods allows the use of small and stiff cantilevers or higher oscillation modes up to the 100MHz regime, as well as the use of multimodal vibrations and amplitude of drive in the 10 pm order. Since excitation acts directly on the oscillator, suprious free excitation is implemented both in liquid, air and vacuum. Phase rotation around modes are clean, allowing multiple modulation schemes such as phase modulation and frequency modulation to be employed.
  • ダミ
    ロン
    デニス
    , アラン ピエール, 鳥山 陽平, オスマン モハンマド, 小林 大, 川勝 英樹
    生産研究
    2015年 67 巻 5 号 545-550
    発行日: 2015/09/01
    公開日: 2015/10/05
    ジャーナル フリー
    Non-contact mode Atomic Force Microscopy is a very useful tool for precise measurement and mapping of the tip-sample interaction force. In the laboratory, several works were focused on the use of all-optic UHV AFMs for atomic resolution imaging with high frequency (1-200 MHz) and low amplitude of drive (10-100 pm). We recently implemented a new all-optic AFM for the measurement of gradient of frequency shifts and as a new tool for the development of innovative chemical contrast techniques. Two all-optic AFMs were also implemented into a Transmission Electron Microscope (TEM) and a Field Ion Microscope (FIM) for new applications in the field of surface chemistry. All the technical aspects covering high resolution imaging with all-optic AFM will be discussed in the former part of this review and their new implementations for gradient of frequency shift measurement in the latter.
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